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EELS at very high energy losses

Electron energy-loss spectroscopy (EELS) has been investigated in the range from 2 to >10 keV using an optimized optical coupling of the microscope to the spectrometer to improve the high loss performance in EELS. It is found that excellent quality data can now be acquired up until about 5 keV, s...

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Autores principales: MacLaren, Ian, Annand, Kirsty J, Black, Colin, Craven, Alan J
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Oxford University Press 2018
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6025225/
https://www.ncbi.nlm.nih.gov/pubmed/29036593
http://dx.doi.org/10.1093/jmicro/dfx036
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author MacLaren, Ian
Annand, Kirsty J
Black, Colin
Craven, Alan J
author_facet MacLaren, Ian
Annand, Kirsty J
Black, Colin
Craven, Alan J
author_sort MacLaren, Ian
collection PubMed
description Electron energy-loss spectroscopy (EELS) has been investigated in the range from 2 to >10 keV using an optimized optical coupling of the microscope to the spectrometer to improve the high loss performance in EELS. It is found that excellent quality data can now be acquired up until about 5 keV, suitable for both energy loss near edge structure (ELNES) studies of oxidation and local chemistry, and potentially useful for extended energy loss fine structure (EXELFS) studies of local atomic ordering. Examples studied included oxidation in Zr, Mo and Sn, and the ELNES and EXELFS of the Ti-K edge. It is also shown that good quality electron energy-loss spectroscopy can even be performed for losses above 9.2 keV, the energy loss at which the collection angle becomes ‘infinite’, and this is demonstrated using the tungsten L(3) edge at about 10.2 keV.
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spelling pubmed-60252252018-07-10 EELS at very high energy losses MacLaren, Ian Annand, Kirsty J Black, Colin Craven, Alan J Microscopy (Oxf) Article Electron energy-loss spectroscopy (EELS) has been investigated in the range from 2 to >10 keV using an optimized optical coupling of the microscope to the spectrometer to improve the high loss performance in EELS. It is found that excellent quality data can now be acquired up until about 5 keV, suitable for both energy loss near edge structure (ELNES) studies of oxidation and local chemistry, and potentially useful for extended energy loss fine structure (EXELFS) studies of local atomic ordering. Examples studied included oxidation in Zr, Mo and Sn, and the ELNES and EXELFS of the Ti-K edge. It is also shown that good quality electron energy-loss spectroscopy can even be performed for losses above 9.2 keV, the energy loss at which the collection angle becomes ‘infinite’, and this is demonstrated using the tungsten L(3) edge at about 10.2 keV. Oxford University Press 2018-03 2017-09-21 /pmc/articles/PMC6025225/ /pubmed/29036593 http://dx.doi.org/10.1093/jmicro/dfx036 Text en © The Author 2016. Published by Oxford University Press on behalf of The Japanese Society of Microscopy. http://creativecommons.org/licenses/by/4.0/ This is an Open Access article distributed under the terms of the Creative Commons Attribution License (http://creativecommons.org/licenses/by/4.0/), which permits unrestricted reuse, distribution, and reproduction in any medium, provided the original work is properly cited.
spellingShingle Article
MacLaren, Ian
Annand, Kirsty J
Black, Colin
Craven, Alan J
EELS at very high energy losses
title EELS at very high energy losses
title_full EELS at very high energy losses
title_fullStr EELS at very high energy losses
title_full_unstemmed EELS at very high energy losses
title_short EELS at very high energy losses
title_sort eels at very high energy losses
topic Article
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6025225/
https://www.ncbi.nlm.nih.gov/pubmed/29036593
http://dx.doi.org/10.1093/jmicro/dfx036
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