Correcting the linear and nonlinear distortions for atomically resolved STEM spectrum and diffraction imaging

Specimen and stage drift as well as scan distortions can lead to a mismatch between true and desired electron probe positions in scanning transmission electron microscopy (STEM) which can result in both linear and nonlinear distortions in the subsequent experimental images. This problem is intensifi...

Descripción completa

Detalles Bibliográficos
Autores principales: Wang, Yi, Suyolcu, Y Eren, Salzberger, Ute, Hahn, Kersten, Srot, Vesna, Sigle, Wilfried, van Aken, Peter A
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Oxford University Press 2018
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6025237/
https://www.ncbi.nlm.nih.gov/pubmed/29385502
http://dx.doi.org/10.1093/jmicro/dfy002

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6025237/
https://www.ncbi.nlm.nih.gov/pubmed/29385502
http://dx.doi.org/10.1093/jmicro/dfy002

Ejemplares similares