Structural determination of bilayer graphene on SiC(0001) using synchrotron radiation photoelectron diffraction

In recent years there has been growing interest in the electronic properties of ‘few layer’ graphene films. Twisted layers, different stacking and register with the substrate result in remarkable unconventional couplings. These distinctive electronic behaviours have been attributed to structural dif...

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Detalles Bibliográficos
Autores principales: Razado-Colambo, I., Avila, J., Vignaud, D., Godey, S., Wallart, X., Woodruff, D. P., Asensio, M. C.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group UK 2018
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6033894/
https://www.ncbi.nlm.nih.gov/pubmed/29976962
http://dx.doi.org/10.1038/s41598-018-28402-0

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6033894/
https://www.ncbi.nlm.nih.gov/pubmed/29976962
http://dx.doi.org/10.1038/s41598-018-28402-0

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