Microstructure characterization of BaSnO(3) thin films on LaAlO(3) and PrScO(3) substrates from transmission electron microscopy

Detailed microstructure analysis of epitaxial thin films is a vital step towards understanding essential structure-property relationships. Here, a combination of transmission electron microscopy (TEM) techniques is utilized to determine in detail the microstructure of epitaxial La-doped BaSnO(3) fil...

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Detalles Bibliográficos
Autores principales: Yun, Hwanhui, Ganguly, Koustav, Postiglione, William, Jalan, Bharat, Leighton, Chris, Mkhoyan, K. Andre, Jeong, Jong Seok
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group UK 2018
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6035271/
https://www.ncbi.nlm.nih.gov/pubmed/29980713
http://dx.doi.org/10.1038/s41598-018-28520-9

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6035271/
https://www.ncbi.nlm.nih.gov/pubmed/29980713
http://dx.doi.org/10.1038/s41598-018-28520-9

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