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Characterization of the X-ray coherence properties of an undulator beamline at the Advanced Photon Source

In anticipation of the increased use of coherent X-ray methods and the need to upgrade beamlines to match improved source quality, here the coherence properties of the X-rays delivered by beamline 12ID-D at the Advanced Photon Source have been characterized. The measured X-ray divergence, beam size,...

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Autores principales: Ju, Guangxu, Highland, Matthew J., Thompson, Carol, Eastman, Jeffrey A., Fuoss, Paul H., Zhou, Hua, Dejus, Roger, Stephenson, G. Brian
Formato: Online Artículo Texto
Lenguaje:English
Publicado: International Union of Crystallography 2018
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6038611/
https://www.ncbi.nlm.nih.gov/pubmed/29979165
http://dx.doi.org/10.1107/S1600577518006501
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author Ju, Guangxu
Highland, Matthew J.
Thompson, Carol
Eastman, Jeffrey A.
Fuoss, Paul H.
Zhou, Hua
Dejus, Roger
Stephenson, G. Brian
author_facet Ju, Guangxu
Highland, Matthew J.
Thompson, Carol
Eastman, Jeffrey A.
Fuoss, Paul H.
Zhou, Hua
Dejus, Roger
Stephenson, G. Brian
author_sort Ju, Guangxu
collection PubMed
description In anticipation of the increased use of coherent X-ray methods and the need to upgrade beamlines to match improved source quality, here the coherence properties of the X-rays delivered by beamline 12ID-D at the Advanced Photon Source have been characterized. The measured X-ray divergence, beam size, brightness and coherent flux at energies up to 26 keV are compared with the calculated values from the undulator source, and the effects of beamline optics such as a mirror, monochromator and compound refractive lenses are evaluated. Diffraction patterns from slits as a function of slit width are analyzed using wave propagation theory to obtain the beam divergence and thus coherence length. Imaging of the source using a compound refractive lens was found to be the most accurate method for determining the vertical divergence. While the brightness and coherent flux obtained without a monochromator (‘pink beam’) agree well with those calculated for the source, those measured with the monochromator were a factor of three to six lower than the source, primarily because of vertical divergence introduced by the monochromator. The methods described herein should be widely applicable for measuring the X-ray coherence properties of synchrotron beamlines.
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spelling pubmed-60386112018-07-12 Characterization of the X-ray coherence properties of an undulator beamline at the Advanced Photon Source Ju, Guangxu Highland, Matthew J. Thompson, Carol Eastman, Jeffrey A. Fuoss, Paul H. Zhou, Hua Dejus, Roger Stephenson, G. Brian J Synchrotron Radiat Research Papers In anticipation of the increased use of coherent X-ray methods and the need to upgrade beamlines to match improved source quality, here the coherence properties of the X-rays delivered by beamline 12ID-D at the Advanced Photon Source have been characterized. The measured X-ray divergence, beam size, brightness and coherent flux at energies up to 26 keV are compared with the calculated values from the undulator source, and the effects of beamline optics such as a mirror, monochromator and compound refractive lenses are evaluated. Diffraction patterns from slits as a function of slit width are analyzed using wave propagation theory to obtain the beam divergence and thus coherence length. Imaging of the source using a compound refractive lens was found to be the most accurate method for determining the vertical divergence. While the brightness and coherent flux obtained without a monochromator (‘pink beam’) agree well with those calculated for the source, those measured with the monochromator were a factor of three to six lower than the source, primarily because of vertical divergence introduced by the monochromator. The methods described herein should be widely applicable for measuring the X-ray coherence properties of synchrotron beamlines. International Union of Crystallography 2018-06-13 /pmc/articles/PMC6038611/ /pubmed/29979165 http://dx.doi.org/10.1107/S1600577518006501 Text en © Guangxu Ju et al. 2018 http://creativecommons.org/licenses/by/2.0/uk/ This is an open-access article distributed under the terms of the Creative Commons Attribution (CC-BY) Licence, which permits unrestricted use, distribution, and reproduction in any medium, provided the original authors and source are cited.http://creativecommons.org/licenses/by/2.0/uk/
spellingShingle Research Papers
Ju, Guangxu
Highland, Matthew J.
Thompson, Carol
Eastman, Jeffrey A.
Fuoss, Paul H.
Zhou, Hua
Dejus, Roger
Stephenson, G. Brian
Characterization of the X-ray coherence properties of an undulator beamline at the Advanced Photon Source
title Characterization of the X-ray coherence properties of an undulator beamline at the Advanced Photon Source
title_full Characterization of the X-ray coherence properties of an undulator beamline at the Advanced Photon Source
title_fullStr Characterization of the X-ray coherence properties of an undulator beamline at the Advanced Photon Source
title_full_unstemmed Characterization of the X-ray coherence properties of an undulator beamline at the Advanced Photon Source
title_short Characterization of the X-ray coherence properties of an undulator beamline at the Advanced Photon Source
title_sort characterization of the x-ray coherence properties of an undulator beamline at the advanced photon source
topic Research Papers
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6038611/
https://www.ncbi.nlm.nih.gov/pubmed/29979165
http://dx.doi.org/10.1107/S1600577518006501
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