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Deep-UV photoinduced chemical patterning at the micro- and nanoscale for directed self-assembly

Deep-UV (DUV) laser patterning has been widely used in recent years for micro- and nanopatterning, taking advantage of the specific properties of irradiation with high-energy photons. In this paper, we show the usefulness of DUV laser patterning for preparing surfaces with controlled chemical proper...

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Autores principales: Leuschel, Benjamin, Gwiazda, Agnieszka, Heni, Wajdi, Diot, Frédéric, Yu, Shang-Yu, Bidaud, Clémentine, Vonna, Laurent, Ponche, Arnaud, Haidara, Hamidou, Soppera, Olivier
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group UK 2018
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6041335/
https://www.ncbi.nlm.nih.gov/pubmed/29992969
http://dx.doi.org/10.1038/s41598-018-28196-1
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author Leuschel, Benjamin
Gwiazda, Agnieszka
Heni, Wajdi
Diot, Frédéric
Yu, Shang-Yu
Bidaud, Clémentine
Vonna, Laurent
Ponche, Arnaud
Haidara, Hamidou
Soppera, Olivier
author_facet Leuschel, Benjamin
Gwiazda, Agnieszka
Heni, Wajdi
Diot, Frédéric
Yu, Shang-Yu
Bidaud, Clémentine
Vonna, Laurent
Ponche, Arnaud
Haidara, Hamidou
Soppera, Olivier
author_sort Leuschel, Benjamin
collection PubMed
description Deep-UV (DUV) laser patterning has been widely used in recent years for micro- and nanopatterning, taking advantage of the specific properties of irradiation with high-energy photons. In this paper, we show the usefulness of DUV laser patterning for preparing surfaces with controlled chemical properties at the micro- and nanoscale. Our motivation was to develop a simple and versatile method for chemical patterning at multiscales (from mm to nm) over relatively wide areas (mm(2) to cm(2)). The chemical properties were provided by self-assembled monolayers (SAMs), prepared on glass or silicon wafers. We first investigated their modification under our irradiation conditions (ArF laser) using AFM, XPS and contact angle measurements. Photopatterning was then demonstrated with minimum feature sizes as small as 75 nm, and we showed the possibility to regraft a second SAM on the irradiated regions. Finally, we used these chemically patterned surfaces for directed self-assembly of several types of objects, such as block copolymers, sol-gel materials and liquids by vapor condensation.
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spelling pubmed-60413352018-07-13 Deep-UV photoinduced chemical patterning at the micro- and nanoscale for directed self-assembly Leuschel, Benjamin Gwiazda, Agnieszka Heni, Wajdi Diot, Frédéric Yu, Shang-Yu Bidaud, Clémentine Vonna, Laurent Ponche, Arnaud Haidara, Hamidou Soppera, Olivier Sci Rep Article Deep-UV (DUV) laser patterning has been widely used in recent years for micro- and nanopatterning, taking advantage of the specific properties of irradiation with high-energy photons. In this paper, we show the usefulness of DUV laser patterning for preparing surfaces with controlled chemical properties at the micro- and nanoscale. Our motivation was to develop a simple and versatile method for chemical patterning at multiscales (from mm to nm) over relatively wide areas (mm(2) to cm(2)). The chemical properties were provided by self-assembled monolayers (SAMs), prepared on glass or silicon wafers. We first investigated their modification under our irradiation conditions (ArF laser) using AFM, XPS and contact angle measurements. Photopatterning was then demonstrated with minimum feature sizes as small as 75 nm, and we showed the possibility to regraft a second SAM on the irradiated regions. Finally, we used these chemically patterned surfaces for directed self-assembly of several types of objects, such as block copolymers, sol-gel materials and liquids by vapor condensation. Nature Publishing Group UK 2018-07-11 /pmc/articles/PMC6041335/ /pubmed/29992969 http://dx.doi.org/10.1038/s41598-018-28196-1 Text en © The Author(s) 2018 Open Access This article is licensed under a Creative Commons Attribution 4.0 International License, which permits use, sharing, adaptation, distribution and reproduction in any medium or format, as long as you give appropriate credit to the original author(s) and the source, provide a link to the Creative Commons license, and indicate if changes were made. The images or other third party material in this article are included in the article’s Creative Commons license, unless indicated otherwise in a credit line to the material. If material is not included in the article’s Creative Commons license and your intended use is not permitted by statutory regulation or exceeds the permitted use, you will need to obtain permission directly from the copyright holder. To view a copy of this license, visit http://creativecommons.org/licenses/by/4.0/.
spellingShingle Article
Leuschel, Benjamin
Gwiazda, Agnieszka
Heni, Wajdi
Diot, Frédéric
Yu, Shang-Yu
Bidaud, Clémentine
Vonna, Laurent
Ponche, Arnaud
Haidara, Hamidou
Soppera, Olivier
Deep-UV photoinduced chemical patterning at the micro- and nanoscale for directed self-assembly
title Deep-UV photoinduced chemical patterning at the micro- and nanoscale for directed self-assembly
title_full Deep-UV photoinduced chemical patterning at the micro- and nanoscale for directed self-assembly
title_fullStr Deep-UV photoinduced chemical patterning at the micro- and nanoscale for directed self-assembly
title_full_unstemmed Deep-UV photoinduced chemical patterning at the micro- and nanoscale for directed self-assembly
title_short Deep-UV photoinduced chemical patterning at the micro- and nanoscale for directed self-assembly
title_sort deep-uv photoinduced chemical patterning at the micro- and nanoscale for directed self-assembly
topic Article
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6041335/
https://www.ncbi.nlm.nih.gov/pubmed/29992969
http://dx.doi.org/10.1038/s41598-018-28196-1
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