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Suppression of atom motion and metal deposition in mixed ionic electronic conductors
Many superionic mixed ionic–electronic conductors with a liquid-like sublattice have been identified as high efficiency thermoelectric materials, but their applications are limited due to the possibility of decomposition when subjected to high electronic currents and large temperature gradients. Her...
Autores principales: | , , , , , , , , , , , , , , |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
Nature Publishing Group UK
2018
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6060128/ https://www.ncbi.nlm.nih.gov/pubmed/30046101 http://dx.doi.org/10.1038/s41467-018-05248-8 |
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author | Qiu, Pengfei Agne, Matthias T. Liu, Yongying Zhu, Yaqin Chen, Hongyi Mao, Tao Yang, Jiong Zhang, Wenqing Haile, Sossina M. Zeier, Wolfgang G. Janek, Jürgen Uher, Ctirad Shi, Xun Chen, Lidong Snyder, G. Jeffrey |
author_facet | Qiu, Pengfei Agne, Matthias T. Liu, Yongying Zhu, Yaqin Chen, Hongyi Mao, Tao Yang, Jiong Zhang, Wenqing Haile, Sossina M. Zeier, Wolfgang G. Janek, Jürgen Uher, Ctirad Shi, Xun Chen, Lidong Snyder, G. Jeffrey |
author_sort | Qiu, Pengfei |
collection | PubMed |
description | Many superionic mixed ionic–electronic conductors with a liquid-like sublattice have been identified as high efficiency thermoelectric materials, but their applications are limited due to the possibility of decomposition when subjected to high electronic currents and large temperature gradients. Here, through systematically investigating electromigration in copper sulfide/selenide thermoelectric materials, we reveal the mechanism for atom migration and deposition based on a critical chemical potential difference. Then, a strategy for stable use is proposed: constructing a series of electronically conducting, but ion-blocking barriers to reset the chemical potential of such conductors to keep it below the threshold for decomposition, even if it is used with high electric currents and/or large temperature differences. This strategy not only opens the possibility of using such conductors in thermoelectric applications, but may also provide approaches to engineer perovskite photovoltaic materials and the experimental methods may be applicable to understanding dendrite growth in lithium ion batteries. |
format | Online Article Text |
id | pubmed-6060128 |
institution | National Center for Biotechnology Information |
language | English |
publishDate | 2018 |
publisher | Nature Publishing Group UK |
record_format | MEDLINE/PubMed |
spelling | pubmed-60601282018-07-27 Suppression of atom motion and metal deposition in mixed ionic electronic conductors Qiu, Pengfei Agne, Matthias T. Liu, Yongying Zhu, Yaqin Chen, Hongyi Mao, Tao Yang, Jiong Zhang, Wenqing Haile, Sossina M. Zeier, Wolfgang G. Janek, Jürgen Uher, Ctirad Shi, Xun Chen, Lidong Snyder, G. Jeffrey Nat Commun Article Many superionic mixed ionic–electronic conductors with a liquid-like sublattice have been identified as high efficiency thermoelectric materials, but their applications are limited due to the possibility of decomposition when subjected to high electronic currents and large temperature gradients. Here, through systematically investigating electromigration in copper sulfide/selenide thermoelectric materials, we reveal the mechanism for atom migration and deposition based on a critical chemical potential difference. Then, a strategy for stable use is proposed: constructing a series of electronically conducting, but ion-blocking barriers to reset the chemical potential of such conductors to keep it below the threshold for decomposition, even if it is used with high electric currents and/or large temperature differences. This strategy not only opens the possibility of using such conductors in thermoelectric applications, but may also provide approaches to engineer perovskite photovoltaic materials and the experimental methods may be applicable to understanding dendrite growth in lithium ion batteries. Nature Publishing Group UK 2018-07-25 /pmc/articles/PMC6060128/ /pubmed/30046101 http://dx.doi.org/10.1038/s41467-018-05248-8 Text en © The Author(s) 2018 Open Access This article is licensed under a Creative Commons Attribution 4.0 International License, which permits use, sharing, adaptation, distribution and reproduction in any medium or format, as long as you give appropriate credit to the original author(s) and the source, provide a link to the Creative Commons license, and indicate if changes were made. The images or other third party material in this article are included in the article’s Creative Commons license, unless indicated otherwise in a credit line to the material. If material is not included in the article’s Creative Commons license and your intended use is not permitted by statutory regulation or exceeds the permitted use, you will need to obtain permission directly from the copyright holder. To view a copy of this license, visit http://creativecommons.org/licenses/by/4.0/. |
spellingShingle | Article Qiu, Pengfei Agne, Matthias T. Liu, Yongying Zhu, Yaqin Chen, Hongyi Mao, Tao Yang, Jiong Zhang, Wenqing Haile, Sossina M. Zeier, Wolfgang G. Janek, Jürgen Uher, Ctirad Shi, Xun Chen, Lidong Snyder, G. Jeffrey Suppression of atom motion and metal deposition in mixed ionic electronic conductors |
title | Suppression of atom motion and metal deposition in mixed ionic electronic conductors |
title_full | Suppression of atom motion and metal deposition in mixed ionic electronic conductors |
title_fullStr | Suppression of atom motion and metal deposition in mixed ionic electronic conductors |
title_full_unstemmed | Suppression of atom motion and metal deposition in mixed ionic electronic conductors |
title_short | Suppression of atom motion and metal deposition in mixed ionic electronic conductors |
title_sort | suppression of atom motion and metal deposition in mixed ionic electronic conductors |
topic | Article |
url | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6060128/ https://www.ncbi.nlm.nih.gov/pubmed/30046101 http://dx.doi.org/10.1038/s41467-018-05248-8 |
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