Supercritical angle Raman microscopy: a surface-sensitive nanoscale technique without field enhancement

Raman scattering microscopy is a versatile tool for label-free imaging and molecular fingerprint analysis. Here, we provide the first demonstration that the selective collection of scattered signals exceeding the critical angle for total internal reflection enables surface-confined spontaneous Raman...

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Detalles Bibliográficos
Autores principales: Serrano, Diana, Seeger, Stefan
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group 2017
Materias:
Original Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6061911/
https://www.ncbi.nlm.nih.gov/pubmed/30167204
http://dx.doi.org/10.1038/lsa.2017.66

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6061911/
https://www.ncbi.nlm.nih.gov/pubmed/30167204
http://dx.doi.org/10.1038/lsa.2017.66

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