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Supercritical angle Raman microscopy: a surface-sensitive nanoscale technique without field enhancement
Raman scattering microscopy is a versatile tool for label-free imaging and molecular fingerprint analysis. Here, we provide the first demonstration that the selective collection of scattered signals exceeding the critical angle for total internal reflection enables surface-confined spontaneous Raman...
Autores principales: | Serrano, Diana, Seeger, Stefan |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
Nature Publishing Group
2017
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6061911/ https://www.ncbi.nlm.nih.gov/pubmed/30167204 http://dx.doi.org/10.1038/lsa.2017.66 |
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