Update of Single Event Effects Radiation Hardness Assurance of Readout Integrated Circuit of Infrared Image Sensors at Cryogenic Temperature

This paper review presents Single Event Effects (SEE) irradiation tests under heavy ions of the test-chip of D-Flip-Flop (DFF) cells and complete readout integrated circuits (ROIC) as a function of temperature, down to 50 K. The analyses of the experimental data are completed using the SEE predictio...

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Detalles Bibliográficos
Autores principales: Artola, Laurent, Youssef, Ahmad Al, Ducret, Samuel, Perrier, Franck, Buiron, Raphael, Gilard, Olivier, Mekki, Julien, Boutillier, Mathieu, Hubert, Guillaume, Poivey, Christian
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2018
Materias:
Review
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6068564/
https://www.ncbi.nlm.nih.gov/pubmed/30022012
http://dx.doi.org/10.3390/s18072338

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6068564/
https://www.ncbi.nlm.nih.gov/pubmed/30022012
http://dx.doi.org/10.3390/s18072338

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