A variable probe pitch micro-Hall effect method

Hall effect metrology is important for a detailed characterization of the electronic properties of new materials for nanoscale electronics. The micro-Hall effect (MHE) method, based on micro four-point probes, enables a fast characterization of ultrathin films with minimal sample preparation. Here,...

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Detalles Bibliográficos
Autores principales: Witthøft, Maria-Louise, Østerberg, Frederik W, Bogdanowicz, Janusz, Lin, Rong, Henrichsen, Henrik H, Hansen, Ole, Petersen, Dirch H
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Beilstein-Institut 2018
Materias:
Full Research Paper
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6071715/
https://www.ncbi.nlm.nih.gov/pubmed/30116693
http://dx.doi.org/10.3762/bjnano.9.192

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6071715/
https://www.ncbi.nlm.nih.gov/pubmed/30116693
http://dx.doi.org/10.3762/bjnano.9.192

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