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A variable probe pitch micro-Hall effect method
Hall effect metrology is important for a detailed characterization of the electronic properties of new materials for nanoscale electronics. The micro-Hall effect (MHE) method, based on micro four-point probes, enables a fast characterization of ultrathin films with minimal sample preparation. Here,...
Autores principales: | Witthøft, Maria-Louise, Østerberg, Frederik W, Bogdanowicz, Janusz, Lin, Rong, Henrichsen, Henrik H, Hansen, Ole, Petersen, Dirch H |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
Beilstein-Institut
2018
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6071715/ https://www.ncbi.nlm.nih.gov/pubmed/30116693 http://dx.doi.org/10.3762/bjnano.9.192 |
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