Cargando…
Comparison of central corneal thickness measurement with Sirius Topographer and Nidek Axial Length Scan
Autor principal: | Mansoori, Tarannum |
---|---|
Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
Medknow Publications & Media Pvt Ltd
2018
|
Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6080436/ https://www.ncbi.nlm.nih.gov/pubmed/30038194 http://dx.doi.org/10.4103/ijo.IJO_431_18 |
Ejemplares similares
-
Comparison of anterior segment measurements using Sirius Topographer(®) and Nidek Axial Length-Scan(®) with assessing repeatability in patients with cataracts
por: Duman, Resat, et al.
Publicado: (2018) -
Comparison of central corneal thickness measurements using different imaging devices and ultrasound pachymetry
por: Mansoori, Tarannum
Publicado: (2019) -
Central corneal thickness and anterior chamber depth measurement by Sirius(®) Scheimpflug tomography and ultrasound
por: Jorge, J, et al.
Publicado: (2013) -
Measurement of corneal thickness using Pentacam HR versus Nidek
CEM-530 specular microscopy
por: De Bernardo, Maddalena, et al.
Publicado: (2019) -
Sirius Scheimpflug–Placido versus ultrasound pachymetry for central corneal thickness: meta-analysis
por: Jin, Yili, et al.
Publicado: (2021)