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Tightly binding valence electron in aluminum observed through X-ray charge density study
Accurate and high reciprocal resolution experimental structure factors of aluminum were determined from a synchrotron powder X-ray diffraction data measured at 30 K with sin θ/λ < 2.31 Å(−1). The structure factors have small deviations from independent atom model in sin θ/λ < 0.83 Å(−1). Theor...
| Autores principales: | , , |
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
| Publicado: |
Nature Publishing Group UK
2018
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| Materias: | |
| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6086884/ https://www.ncbi.nlm.nih.gov/pubmed/30097629 http://dx.doi.org/10.1038/s41598-018-30470-1 |