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Anomalous Nonlinear Shot Noise at High Voltage Bias

[Image: see text] Since the work of Walter Schottky, it is known that the shot-noise power for a completely uncorrelated set of electrons increases linearly with the time-averaged current. At zero temperature and in the absence of inelastic scattering, the linearity relation between noise power and...

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Autores principales: Tewari, Sumit, van Ruitenbeek, Jan
Formato: Online Artículo Texto
Lenguaje:English
Publicado: American Chemical Society 2018
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6089497/
https://www.ncbi.nlm.nih.gov/pubmed/29957997
http://dx.doi.org/10.1021/acs.nanolett.8b02176
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author Tewari, Sumit
van Ruitenbeek, Jan
author_facet Tewari, Sumit
van Ruitenbeek, Jan
author_sort Tewari, Sumit
collection PubMed
description [Image: see text] Since the work of Walter Schottky, it is known that the shot-noise power for a completely uncorrelated set of electrons increases linearly with the time-averaged current. At zero temperature and in the absence of inelastic scattering, the linearity relation between noise power and average current is quite robust, in many cases even for correlated electrons. Through high-bias shot-noise measurements on single Au atom point contacts, we find that the noise power in the high-bias regime shows highly nonlinear behavior even leading to a decrease in shot noise with voltage. We explain this nonlinearity using a model based on quantum interference of electron waves with varying path difference due to scattering from randomly distributed defect sites in the leads, which makes the transmission probability for these electrons both energy and voltage dependent.
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spelling pubmed-60894972018-08-14 Anomalous Nonlinear Shot Noise at High Voltage Bias Tewari, Sumit van Ruitenbeek, Jan Nano Lett [Image: see text] Since the work of Walter Schottky, it is known that the shot-noise power for a completely uncorrelated set of electrons increases linearly with the time-averaged current. At zero temperature and in the absence of inelastic scattering, the linearity relation between noise power and average current is quite robust, in many cases even for correlated electrons. Through high-bias shot-noise measurements on single Au atom point contacts, we find that the noise power in the high-bias regime shows highly nonlinear behavior even leading to a decrease in shot noise with voltage. We explain this nonlinearity using a model based on quantum interference of electron waves with varying path difference due to scattering from randomly distributed defect sites in the leads, which makes the transmission probability for these electrons both energy and voltage dependent. American Chemical Society 2018-06-29 2018-08-08 /pmc/articles/PMC6089497/ /pubmed/29957997 http://dx.doi.org/10.1021/acs.nanolett.8b02176 Text en Copyright © 2018 American Chemical Society This is an open access article published under a Creative Commons Non-Commercial No Derivative Works (CC-BY-NC-ND) Attribution License (http://pubs.acs.org/page/policy/authorchoice_ccbyncnd_termsofuse.html) , which permits copying and redistribution of the article, and creation of adaptations, all for non-commercial purposes.
spellingShingle Tewari, Sumit
van Ruitenbeek, Jan
Anomalous Nonlinear Shot Noise at High Voltage Bias
title Anomalous Nonlinear Shot Noise at High Voltage Bias
title_full Anomalous Nonlinear Shot Noise at High Voltage Bias
title_fullStr Anomalous Nonlinear Shot Noise at High Voltage Bias
title_full_unstemmed Anomalous Nonlinear Shot Noise at High Voltage Bias
title_short Anomalous Nonlinear Shot Noise at High Voltage Bias
title_sort anomalous nonlinear shot noise at high voltage bias
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6089497/
https://www.ncbi.nlm.nih.gov/pubmed/29957997
http://dx.doi.org/10.1021/acs.nanolett.8b02176
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