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Large-area Scanning Probe Nanolithography Facilitated by Automated Alignment and Its Application to Substrate Fabrication for Cell Culture Studies

Scanning probe microscopy has enabled the creation of a variety of methods for the constructive ('additive') top-down fabrication of nanometer-scale features. Historically, a major drawback of scanning probe lithography has been the intrinsically low throughput of single probe systems. Thi...

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Detalles Bibliográficos
Autores principales: Lee, I-Ning, Hosford, Joseph, Wang, Shuai, Hunt, John A., Curran, Judith M., Heath, William P., Wong, Lu Shin
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MyJove Corporation 2018
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6101695/
https://www.ncbi.nlm.nih.gov/pubmed/29985313
http://dx.doi.org/10.3791/56967

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