A debug scheme to improve the error identification in post-silicon validation

While developing semiconductors, post-silicon validation is an important step to identify the errors that are not detected during the pre-silicon verification and manufacturing testing phases. When the design complexity increases, the required debug time also increases because additional debug data...

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Detalles Bibliográficos
Autores principales: Choi, Inhyuk, Jung, Won, Oh, Hyunggoy, Kang, Sungho
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Public Library of Science 2018
Materias:
Research Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6122784/
https://www.ncbi.nlm.nih.gov/pubmed/30180170
http://dx.doi.org/10.1371/journal.pone.0202216

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6122784/
https://www.ncbi.nlm.nih.gov/pubmed/30180170
http://dx.doi.org/10.1371/journal.pone.0202216

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