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A debug scheme to improve the error identification in post-silicon validation
While developing semiconductors, post-silicon validation is an important step to identify the errors that are not detected during the pre-silicon verification and manufacturing testing phases. When the design complexity increases, the required debug time also increases because additional debug data...
| Autores principales: | , , , |
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
| Publicado: |
Public Library of Science
2018
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| Materias: | |
| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6122784/ https://www.ncbi.nlm.nih.gov/pubmed/30180170 http://dx.doi.org/10.1371/journal.pone.0202216 |