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Soft Nondamaging Contacts Formed from Eutectic Ga–In for the Accurate Determination of Dielectric Constants of Organic Materials
[Image: see text] A method for accurately measuring the relative dielectric constant (ε(r)) of thin films of soft, organic materials is described. The effects of the bombardment of these materials with hot Al atoms, the most commonly used top electrode, are mitigated by using electrodes fabricated f...
Autores principales: | , , , , , , |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
American Chemical
Society
2018
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Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6122948/ https://www.ncbi.nlm.nih.gov/pubmed/30197469 http://dx.doi.org/10.1021/acs.chemmater.8b02212 |
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author | Douvogianni, Evgenia Qiu, Xinkai Qiu, Li Jahani, Fatemeh Kooistra, Floris B. Hummelen, Jan C. Chiechi, Ryan C. |
author_facet | Douvogianni, Evgenia Qiu, Xinkai Qiu, Li Jahani, Fatemeh Kooistra, Floris B. Hummelen, Jan C. Chiechi, Ryan C. |
author_sort | Douvogianni, Evgenia |
collection | PubMed |
description | [Image: see text] A method for accurately measuring the relative dielectric constant (ε(r)) of thin films of soft, organic materials is described. The effects of the bombardment of these materials with hot Al atoms, the most commonly used top electrode, are mitigated by using electrodes fabricated from eutectic gallium–indium (EGaIn). The geometry of the electrode is defined by injection into microchannels to form stable structures that are nondamaging and that conform to the topology of the organic thin film. The ε(r) of a series of references and new organic materials, polymers, and fullerene derivatives was derived from impedance spectroscopy measurements for both Al and EGaIn electrodes showing the specific limitations of Al with soft, organic materials and overcoming them with EGaIn to determine their dielectric properties and provide realistic values of ε(r). |
format | Online Article Text |
id | pubmed-6122948 |
institution | National Center for Biotechnology Information |
language | English |
publishDate | 2018 |
publisher | American Chemical
Society |
record_format | MEDLINE/PubMed |
spelling | pubmed-61229482018-09-06 Soft Nondamaging Contacts Formed from Eutectic Ga–In for the Accurate Determination of Dielectric Constants of Organic Materials Douvogianni, Evgenia Qiu, Xinkai Qiu, Li Jahani, Fatemeh Kooistra, Floris B. Hummelen, Jan C. Chiechi, Ryan C. Chem Mater [Image: see text] A method for accurately measuring the relative dielectric constant (ε(r)) of thin films of soft, organic materials is described. The effects of the bombardment of these materials with hot Al atoms, the most commonly used top electrode, are mitigated by using electrodes fabricated from eutectic gallium–indium (EGaIn). The geometry of the electrode is defined by injection into microchannels to form stable structures that are nondamaging and that conform to the topology of the organic thin film. The ε(r) of a series of references and new organic materials, polymers, and fullerene derivatives was derived from impedance spectroscopy measurements for both Al and EGaIn electrodes showing the specific limitations of Al with soft, organic materials and overcoming them with EGaIn to determine their dielectric properties and provide realistic values of ε(r). American Chemical Society 2018-08-03 2018-08-28 /pmc/articles/PMC6122948/ /pubmed/30197469 http://dx.doi.org/10.1021/acs.chemmater.8b02212 Text en Copyright © 2018 American Chemical Society This is an open access article published under a Creative Commons Non-Commercial No Derivative Works (CC-BY-NC-ND) Attribution License (http://pubs.acs.org/page/policy/authorchoice_ccbyncnd_termsofuse.html) , which permits copying and redistribution of the article, and creation of adaptations, all for non-commercial purposes. |
spellingShingle | Douvogianni, Evgenia Qiu, Xinkai Qiu, Li Jahani, Fatemeh Kooistra, Floris B. Hummelen, Jan C. Chiechi, Ryan C. Soft Nondamaging Contacts Formed from Eutectic Ga–In for the Accurate Determination of Dielectric Constants of Organic Materials |
title | Soft Nondamaging Contacts Formed from Eutectic Ga–In
for the Accurate Determination of Dielectric Constants of Organic
Materials |
title_full | Soft Nondamaging Contacts Formed from Eutectic Ga–In
for the Accurate Determination of Dielectric Constants of Organic
Materials |
title_fullStr | Soft Nondamaging Contacts Formed from Eutectic Ga–In
for the Accurate Determination of Dielectric Constants of Organic
Materials |
title_full_unstemmed | Soft Nondamaging Contacts Formed from Eutectic Ga–In
for the Accurate Determination of Dielectric Constants of Organic
Materials |
title_short | Soft Nondamaging Contacts Formed from Eutectic Ga–In
for the Accurate Determination of Dielectric Constants of Organic
Materials |
title_sort | soft nondamaging contacts formed from eutectic ga–in
for the accurate determination of dielectric constants of organic
materials |
url | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6122948/ https://www.ncbi.nlm.nih.gov/pubmed/30197469 http://dx.doi.org/10.1021/acs.chemmater.8b02212 |
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