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Soft Nondamaging Contacts Formed from Eutectic Ga–In for the Accurate Determination of Dielectric Constants of Organic Materials
[Image: see text] A method for accurately measuring the relative dielectric constant (ε(r)) of thin films of soft, organic materials is described. The effects of the bombardment of these materials with hot Al atoms, the most commonly used top electrode, are mitigated by using electrodes fabricated f...
Autores principales: | , , , , , , |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
American Chemical
Society
2018
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Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6122948/ https://www.ncbi.nlm.nih.gov/pubmed/30197469 http://dx.doi.org/10.1021/acs.chemmater.8b02212 |