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High Trapped Fields in C-doped MgB(2) Bulk Superconductors Fabricated by Infiltration and Growth Process
The grain boundaries in superconducting MgB(2) are known to form effective magnetic flux pinning sites and, consequently, bulk MgB(2) containing a fine-grain microstructure fabricated from nanoscale Mg and B precursor powders exhibits good magnetic field-trapping performance below 20 K. We report he...
Autores principales: | , , , , , , , , |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
Nature Publishing Group UK
2018
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6127330/ https://www.ncbi.nlm.nih.gov/pubmed/30190578 http://dx.doi.org/10.1038/s41598-018-31416-3 |
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author | Bhagurkar, A. G. Yamamoto, A. Wang, L. Xia, M. Dennis, A. R. Durrell, J. H. Aljohani, T. A. Babu, N. H. Cardwell, D. A. |
author_facet | Bhagurkar, A. G. Yamamoto, A. Wang, L. Xia, M. Dennis, A. R. Durrell, J. H. Aljohani, T. A. Babu, N. H. Cardwell, D. A. |
author_sort | Bhagurkar, A. G. |
collection | PubMed |
description | The grain boundaries in superconducting MgB(2) are known to form effective magnetic flux pinning sites and, consequently, bulk MgB(2) containing a fine-grain microstructure fabricated from nanoscale Mg and B precursor powders exhibits good magnetic field-trapping performance below 20 K. We report here that the trapped field of MgB(2) bulk superconductors fabricated by an infiltration and growth process to yield a dense, pore-free microstructure, can be enhanced significantly by carbon-doping, which increases intra-band scattering within the superconducting grains. A maximum trapped field of 4.15 T has been measured at 7.5 K at the centre of a five-sample stack of Mg(B(1−xi)C(xi))(2) bulk superconductors processed by infiltration and growth, which not only represents a ~40% increase in trapped field observed compared to undoped bulk MgB(2), but also is the highest trapped field reported to date in MgB(2) samples processed under ambient pressure. The trapped field is observed to decay at a rate of <2%/day at 10 K, which suggests that bulk MgB(2) superconductors fabricated using the infiltration and growth technique can be used potentially to generate stable, high magnetic fields for a variety of engineering applications. |
format | Online Article Text |
id | pubmed-6127330 |
institution | National Center for Biotechnology Information |
language | English |
publishDate | 2018 |
publisher | Nature Publishing Group UK |
record_format | MEDLINE/PubMed |
spelling | pubmed-61273302018-09-10 High Trapped Fields in C-doped MgB(2) Bulk Superconductors Fabricated by Infiltration and Growth Process Bhagurkar, A. G. Yamamoto, A. Wang, L. Xia, M. Dennis, A. R. Durrell, J. H. Aljohani, T. A. Babu, N. H. Cardwell, D. A. Sci Rep Article The grain boundaries in superconducting MgB(2) are known to form effective magnetic flux pinning sites and, consequently, bulk MgB(2) containing a fine-grain microstructure fabricated from nanoscale Mg and B precursor powders exhibits good magnetic field-trapping performance below 20 K. We report here that the trapped field of MgB(2) bulk superconductors fabricated by an infiltration and growth process to yield a dense, pore-free microstructure, can be enhanced significantly by carbon-doping, which increases intra-band scattering within the superconducting grains. A maximum trapped field of 4.15 T has been measured at 7.5 K at the centre of a five-sample stack of Mg(B(1−xi)C(xi))(2) bulk superconductors processed by infiltration and growth, which not only represents a ~40% increase in trapped field observed compared to undoped bulk MgB(2), but also is the highest trapped field reported to date in MgB(2) samples processed under ambient pressure. The trapped field is observed to decay at a rate of <2%/day at 10 K, which suggests that bulk MgB(2) superconductors fabricated using the infiltration and growth technique can be used potentially to generate stable, high magnetic fields for a variety of engineering applications. Nature Publishing Group UK 2018-09-06 /pmc/articles/PMC6127330/ /pubmed/30190578 http://dx.doi.org/10.1038/s41598-018-31416-3 Text en © The Author(s) 2018 Open Access This article is licensed under a Creative Commons Attribution 4.0 International License, which permits use, sharing, adaptation, distribution and reproduction in any medium or format, as long as you give appropriate credit to the original author(s) and the source, provide a link to the Creative Commons license, and indicate if changes were made. The images or other third party material in this article are included in the article’s Creative Commons license, unless indicated otherwise in a credit line to the material. If material is not included in the article’s Creative Commons license and your intended use is not permitted by statutory regulation or exceeds the permitted use, you will need to obtain permission directly from the copyright holder. To view a copy of this license, visit http://creativecommons.org/licenses/by/4.0/. |
spellingShingle | Article Bhagurkar, A. G. Yamamoto, A. Wang, L. Xia, M. Dennis, A. R. Durrell, J. H. Aljohani, T. A. Babu, N. H. Cardwell, D. A. High Trapped Fields in C-doped MgB(2) Bulk Superconductors Fabricated by Infiltration and Growth Process |
title | High Trapped Fields in C-doped MgB(2) Bulk Superconductors Fabricated by Infiltration and Growth Process |
title_full | High Trapped Fields in C-doped MgB(2) Bulk Superconductors Fabricated by Infiltration and Growth Process |
title_fullStr | High Trapped Fields in C-doped MgB(2) Bulk Superconductors Fabricated by Infiltration and Growth Process |
title_full_unstemmed | High Trapped Fields in C-doped MgB(2) Bulk Superconductors Fabricated by Infiltration and Growth Process |
title_short | High Trapped Fields in C-doped MgB(2) Bulk Superconductors Fabricated by Infiltration and Growth Process |
title_sort | high trapped fields in c-doped mgb(2) bulk superconductors fabricated by infiltration and growth process |
topic | Article |
url | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6127330/ https://www.ncbi.nlm.nih.gov/pubmed/30190578 http://dx.doi.org/10.1038/s41598-018-31416-3 |
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