Review for Retrospective Exposure Assessment Methods Used in Epidemiologic Cancer Risk Studies of Semiconductor Workers: Limitations and Recommendations

This article aims to provide a systematic review of the exposure assessment methods used to assign wafer fabrication (fab) workers in epidemiologic cohort studies of mortality from all causes and various cancers. Epidemiologic and exposure–assessment studies of silicon wafer fab operations in the se...

Descripción completa

Detalles Bibliográficos
Autor principal: Park, Donguk
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Occupational Safety and Health Research Institute 2018
Materias:
Review Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6129997/
https://www.ncbi.nlm.nih.gov/pubmed/30370156
http://dx.doi.org/10.1016/j.shaw.2018.05.005

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6129997/
https://www.ncbi.nlm.nih.gov/pubmed/30370156
http://dx.doi.org/10.1016/j.shaw.2018.05.005

Ejemplares similares