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Review for Retrospective Exposure Assessment Methods Used in Epidemiologic Cancer Risk Studies of Semiconductor Workers: Limitations and Recommendations
This article aims to provide a systematic review of the exposure assessment methods used to assign wafer fabrication (fab) workers in epidemiologic cohort studies of mortality from all causes and various cancers. Epidemiologic and exposure–assessment studies of silicon wafer fab operations in the se...
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
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Occupational Safety and Health Research Institute
2018
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| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6129997/ https://www.ncbi.nlm.nih.gov/pubmed/30370156 http://dx.doi.org/10.1016/j.shaw.2018.05.005 |