Markov random field segmentation for industrial computed tomography with metal artefacts

X-ray Computed Tomography (XCT) has become an important tool for industrial measurement and quality control through its ability to measure internal structures and volumetric defects. Segmentation of constituent materials in the volume acquired through XCT is one of the most critical factors that inf...

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Detalles Bibliográficos
Autores principales: Jaiswal, Avinash, Williams, Mark A., Bhalerao, Abhir, Tiwari, Manoj K., Warnett, Jason M.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: IOS Press 2018
Materias:
Research Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6130414/
https://www.ncbi.nlm.nih.gov/pubmed/29562573
http://dx.doi.org/10.3233/XST-17322

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6130414/
https://www.ncbi.nlm.nih.gov/pubmed/29562573
http://dx.doi.org/10.3233/XST-17322

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