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Markov random field segmentation for industrial computed tomography with metal artefacts
X-ray Computed Tomography (XCT) has become an important tool for industrial measurement and quality control through its ability to measure internal structures and volumetric defects. Segmentation of constituent materials in the volume acquired through XCT is one of the most critical factors that inf...
Autores principales: | Jaiswal, Avinash, Williams, Mark A., Bhalerao, Abhir, Tiwari, Manoj K., Warnett, Jason M. |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
IOS Press
2018
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6130414/ https://www.ncbi.nlm.nih.gov/pubmed/29562573 http://dx.doi.org/10.3233/XST-17322 |
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