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Direct electric field imaging of graphene defects

Material properties are sensitive to atomistic structure defects such as vacancies or impurities, and it is therefore important to determine not only the local atomic configuration but also their chemical bonding state. Annular dark-field scanning transmission electron microscopy (STEM) combined wit...

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Detalles Bibliográficos
Autores principales:	Ishikawa, Ryo, Findlay, Scott D., Seki, Takehito, Sánchez-Santolino, Gabriel, Kohno, Yuji, Ikuhara, Yuichi, Shibata, Naoya
Formato:	Online Artículo Texto
Lenguaje:	English
Publicado:	Nature Publishing Group UK 2018
Materias:	Article
Acceso en línea:	https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6155138/ https://www.ncbi.nlm.nih.gov/pubmed/30250209 http://dx.doi.org/10.1038/s41467-018-06387-8

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