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A quick convergent-beam laboratory X-ray reflectometer using a simultaneous multiple-angle dispersive geometry
An X-ray reflectometer using a laboratory X-ray source for quick measurements of the specular X-ray reflectivity curve is presented. It uses a bent–twisted crystal to monochromatize and focus the diverging X-rays (Cu Kα(1)) from a laboratory point source onto the sample. The reflected X-rays are rec...
| Autores principales: | , , , , , , |
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
| Publicado: |
International Union of Crystallography
2017
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| Materias: | |
| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6157822/ https://www.ncbi.nlm.nih.gov/pubmed/30319318 http://dx.doi.org/10.1107/S1600576717002461 |