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Investigation of a Three-Dimensional Micro-Scale Sensing System Based on a Tapered Self-Assembly Four-Cores Fiber Bragg Grating Probe

Three-dimensional micro-scale sensors are in high demand in the fields of metrology, precision manufacturing and industry inspection. To extend the minimum measurable dimension and enhance the accuracy, a tapered four-cores fiber Bragg grating (FBG) probe is proposed. The sensing model is built to i...

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Detalles Bibliográficos
Autores principales: Feng, Kunpeng, Cui, Jiwen, Sun, Xun, Dang, Hong, Shi, Tangjun, Niu, Yizhao, Jin, Yihua, Tan, Jiubin
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2018
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6165488/
https://www.ncbi.nlm.nih.gov/pubmed/30150541
http://dx.doi.org/10.3390/s18092824
Descripción
Sumario:Three-dimensional micro-scale sensors are in high demand in the fields of metrology, precision manufacturing and industry inspection. To extend the minimum measurable dimension and enhance the accuracy, a tapered four-cores fiber Bragg grating (FBG) probe is proposed. The sensing model is built to investigate the micro-scale sensing characteristics of this method and the design of the tapered stylus is found to influence the accuracy. Therefore, a π/2 phase-shift point is introduced into the FBGs comprised in the probe to suppress spectrum distortion and improve accuracy. Then, the manufacturing method based on capillary self-assembly is proposed to form the probe and the critical length to form a square array for four cylindrical fibers is verified to be effective for the tapered fibers. Experimental results indicate that the design of the tapered stylus can extend the minimum measurable dimension by twofold and has nearly no influence on its sensitivity. The three-dimensional measurement repeatability is better than 31.1 nm and the stability is better than 200 nm within once measuring process. Furthermore, the measurement precision of the three-dimensional micro-scale measurement results is less than 150 nm. It would be widely used in measuring micro-scale features for industry inspection or metrology.