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Enhanced Interpolated Dynamic DFT Synchrophasor Estimator Considering Second Harmonic Interferences †

In the future, phasor measurement units are expected to be applied in distribution networks (DNs) for their control and monitoring. Because of the widely used power electronic devices in DNs, harmonics are widely present in a voltage/current signal. Particularly, second harmonics have the most signi...

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Detalles Bibliográficos
Autores principales: Chen, Lei, Zhao, Wei, Wang, Fuping, Wang, Qing, Huang, Songling
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2018
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6165603/
https://www.ncbi.nlm.nih.gov/pubmed/30134587
http://dx.doi.org/10.3390/s18092748
Descripción
Sumario:In the future, phasor measurement units are expected to be applied in distribution networks (DNs) for their control and monitoring. Because of the widely used power electronic devices in DNs, harmonics are widely present in a voltage/current signal. Particularly, second harmonics have the most significant uncertainty contributions to synchrophasor estimation, which is especially true when a short cycle observation window is used for a fast response. Based on the interpolated dynamic discrete Fourier transform (IpD [Formula: see text] FT), this paper introduces an enhanced IpD [Formula: see text] FT (e-IpD [Formula: see text] FT) synchrophasor estimator that considers second harmonic interferences. First, the adaptive equivalent filters of the IpD [Formula: see text] FT are given. Based on these, the optimal frequencies where the IpD [Formula: see text] FT has the least second harmonic interferences are then searched using an enumeration method, and the e-IpD [Formula: see text] FT synchrophasor estimator is accordingly proposed. Instantaneous frequency responses and several simulation tests show that the e-IpD [Formula: see text] FT performs much better than the IpD [Formula: see text] FT in second harmonic suppression, and can meet the P-class response time requirements and most of the M-class accuracy requirements of the IEEE standard C37.118.1 only over a three-cycle window.