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The learning curve associated with the implantation of the Nanostim leadless pacemaker
PURPOSE: Use of novel medical technologies, such as leadless pacemaker (LP) therapy, may be subjected to a learning curve effect. The objective of the current study was to assess the impact of operators’ experience on the occurrence of serious adverse device effects (SADE) and procedural efficiency....
Autores principales: | , , , , , , , , , , , , |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
Springer US
2018
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6182715/ https://www.ncbi.nlm.nih.gov/pubmed/30105428 http://dx.doi.org/10.1007/s10840-018-0438-8 |
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author | Tjong, Fleur V.Y. Beurskens, Niek E.G. Neuzil, Petr Defaye, Pascal Delnoy, Peter-Paul Ip, John Guerrero, Juan Jose Garcia Rashtian, Mayer Banker, Rajesh Reddy, Vivek Exner, Derek Sperzel, Johannes Knops, Reinoud E. |
author_facet | Tjong, Fleur V.Y. Beurskens, Niek E.G. Neuzil, Petr Defaye, Pascal Delnoy, Peter-Paul Ip, John Guerrero, Juan Jose Garcia Rashtian, Mayer Banker, Rajesh Reddy, Vivek Exner, Derek Sperzel, Johannes Knops, Reinoud E. |
author_sort | Tjong, Fleur V.Y. |
collection | PubMed |
description | PURPOSE: Use of novel medical technologies, such as leadless pacemaker (LP) therapy, may be subjected to a learning curve effect. The objective of the current study was to assess the impact of operators’ experience on the occurrence of serious adverse device effects (SADE) and procedural efficiency. METHODS: Patients implanted with a Nanostim LP (Abbott, USA) within two prospective studies (i.e., LEADLESS ll IDE and Leadless Observational Study) were assessed. Patients were categorized into quartiles based on operator experience. Learning curve analysis included the comparison of SADE rates at 30 days post-implant per quartile and between patients in quartile 4 (> 10 implants) and patients in quartiles 1 through 3 (1–10 implants). Procedural efficiency was assessed based on procedure duration and repositioning attempts. RESULTS: Nanostim LP implant was performed in 1439 patients by 171 implanters at 60 centers in 10 countries. A total of 91 (6.4%) patients experienced a SADE in the first 30 days. SADE rates dropped from 7.4 to 4.5% (p = 0.038) after more than 10 implants per operator. Total procedure duration decreased from 30.9 ± 19.1 min in quartile 1 to 21.6 ± 13.2 min (p < 0.001) in quartile 4. The need for multiple repositionings during the LP procedure reduced in quartile 4 (14.8%), compared to quartiles 1 (26.8%; p < 0.001), 2 (26.6%; p < 0.001), and 3 (20.4%; p = 0.03). CONCLUSIONS: Learning curves exist for Nanostim LP implantation. Procedure efficiency improved with increased operator experience, according to a decrease in the incidence of SADE, procedure duration, and repositioning attempts. ELECTRONIC SUPPLEMENTARY MATERIAL: The online version of this article (10.1007/s10840-018-0438-8) contains supplementary material, which is available to authorized users. |
format | Online Article Text |
id | pubmed-6182715 |
institution | National Center for Biotechnology Information |
language | English |
publishDate | 2018 |
publisher | Springer US |
record_format | MEDLINE/PubMed |
spelling | pubmed-61827152018-10-24 The learning curve associated with the implantation of the Nanostim leadless pacemaker Tjong, Fleur V.Y. Beurskens, Niek E.G. Neuzil, Petr Defaye, Pascal Delnoy, Peter-Paul Ip, John Guerrero, Juan Jose Garcia Rashtian, Mayer Banker, Rajesh Reddy, Vivek Exner, Derek Sperzel, Johannes Knops, Reinoud E. J Interv Card Electrophysiol Multimedia Report PURPOSE: Use of novel medical technologies, such as leadless pacemaker (LP) therapy, may be subjected to a learning curve effect. The objective of the current study was to assess the impact of operators’ experience on the occurrence of serious adverse device effects (SADE) and procedural efficiency. METHODS: Patients implanted with a Nanostim LP (Abbott, USA) within two prospective studies (i.e., LEADLESS ll IDE and Leadless Observational Study) were assessed. Patients were categorized into quartiles based on operator experience. Learning curve analysis included the comparison of SADE rates at 30 days post-implant per quartile and between patients in quartile 4 (> 10 implants) and patients in quartiles 1 through 3 (1–10 implants). Procedural efficiency was assessed based on procedure duration and repositioning attempts. RESULTS: Nanostim LP implant was performed in 1439 patients by 171 implanters at 60 centers in 10 countries. A total of 91 (6.4%) patients experienced a SADE in the first 30 days. SADE rates dropped from 7.4 to 4.5% (p = 0.038) after more than 10 implants per operator. Total procedure duration decreased from 30.9 ± 19.1 min in quartile 1 to 21.6 ± 13.2 min (p < 0.001) in quartile 4. The need for multiple repositionings during the LP procedure reduced in quartile 4 (14.8%), compared to quartiles 1 (26.8%; p < 0.001), 2 (26.6%; p < 0.001), and 3 (20.4%; p = 0.03). CONCLUSIONS: Learning curves exist for Nanostim LP implantation. Procedure efficiency improved with increased operator experience, according to a decrease in the incidence of SADE, procedure duration, and repositioning attempts. ELECTRONIC SUPPLEMENTARY MATERIAL: The online version of this article (10.1007/s10840-018-0438-8) contains supplementary material, which is available to authorized users. Springer US 2018-08-13 2018 /pmc/articles/PMC6182715/ /pubmed/30105428 http://dx.doi.org/10.1007/s10840-018-0438-8 Text en © The Author(s) 2018 Open Access This article is distributed under the terms of the Creative Commons Attribution 4.0 International License (http://creativecommons.org/licenses/by/4.0/), which permits unrestricted use, distribution, and reproduction in any medium, provided you give appropriate credit to the original author(s) and the source, provide a link to the Creative Commons license, and indicate if changes were made. |
spellingShingle | Multimedia Report Tjong, Fleur V.Y. Beurskens, Niek E.G. Neuzil, Petr Defaye, Pascal Delnoy, Peter-Paul Ip, John Guerrero, Juan Jose Garcia Rashtian, Mayer Banker, Rajesh Reddy, Vivek Exner, Derek Sperzel, Johannes Knops, Reinoud E. The learning curve associated with the implantation of the Nanostim leadless pacemaker |
title | The learning curve associated with the implantation of the Nanostim leadless pacemaker |
title_full | The learning curve associated with the implantation of the Nanostim leadless pacemaker |
title_fullStr | The learning curve associated with the implantation of the Nanostim leadless pacemaker |
title_full_unstemmed | The learning curve associated with the implantation of the Nanostim leadless pacemaker |
title_short | The learning curve associated with the implantation of the Nanostim leadless pacemaker |
title_sort | learning curve associated with the implantation of the nanostim leadless pacemaker |
topic | Multimedia Report |
url | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6182715/ https://www.ncbi.nlm.nih.gov/pubmed/30105428 http://dx.doi.org/10.1007/s10840-018-0438-8 |
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