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MEMS Device for Quantitative In Situ Mechanical Testing in Electron Microscope

In this work, we designed a micro-electromechanical systems (MEMS) device that allows simultaneous direct measurement of mechanical properties during deformation under external stress and characterization of the evolution of nanomaterial microstructure within a transmission electron microscope. This...

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Detalles Bibliográficos
Autores principales:	Wang, Xiaodong, Mao, Shengcheng, Zhang, Jianfei, Li, Zhipeng, Deng, Qingsong, Ning, Jin, Yang, Xudong, Wang, Li, Ji, Yuan, Li, Xiaochen, Liu, Yinong, Zhang, Ze, Han, Xiaodong
Formato:	Online Artículo Texto
Lenguaje:	English
Publicado:	MDPI 2017
Materias:	Article
Acceso en línea:	https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6190302/ http://dx.doi.org/10.3390/mi8020031

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