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Ultrafast time-resolved extreme ultraviolet (XUV) photoelectron spectroscopy of hole transfer in a Zn/n-GaP Schottky junction

The addition of a metal overlayer to a semiconductor photocatalyst is a frequently used synthetic route to passivate the surface and, via the formation of a Schottky barrier, to enhance catalytic activity of the photocatalyst material. While it is known that Schottky junctions decrease recombination...

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Detalles Bibliográficos
Autores principales: Marsh, Brett M., Lamoureux, Bethany R., Leone, Stephen R.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: American Crystallographic Association 2018
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6197984/
https://www.ncbi.nlm.nih.gov/pubmed/30417027
http://dx.doi.org/10.1063/1.5046776

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