Soft X-ray Reflection Spectroscopy for Nano-Scaled Layered Structure Materials

We introduce a novel approach that addresses the probing of interfacial structural phenomena in layered nano-structured films. The approach combines resonant soft x-ray reflection spectroscopy at grazing incidence near the “critical angle” with angular dependent reflection at energies around the res...

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Detalles Bibliográficos
Autores principales: Majhi, A., Nayak, Maheswar, Pradhan, P. C., Filatova, E. O., Sokolov, A., Schäfers, F.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group UK 2018
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6200723/
https://www.ncbi.nlm.nih.gov/pubmed/30356092
http://dx.doi.org/10.1038/s41598-018-34076-5

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6200723/
https://www.ncbi.nlm.nih.gov/pubmed/30356092
http://dx.doi.org/10.1038/s41598-018-34076-5

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