Soft X-ray Reflection Spectroscopy for Nano-Scaled Layered Structure Materials
We introduce a novel approach that addresses the probing of interfacial structural phenomena in layered nano-structured films. The approach combines resonant soft x-ray reflection spectroscopy at grazing incidence near the “critical angle” with angular dependent reflection at energies around the res...
Autores principales: | , , , , , |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
Nature Publishing Group UK
2018
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6200723/ https://www.ncbi.nlm.nih.gov/pubmed/30356092 http://dx.doi.org/10.1038/s41598-018-34076-5 |