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Angular-momentum nanometrology in an ultrathin plasmonic topological insulator film
Complementary metal–oxide–semiconductor (CMOS) technology has provided a highly sensitive detection platform for high-resolution optical imaging, sensing and metrology. Although the detection of optical beams carrying angular momentum have been explored with nanophotonic methods, the metrology of op...
| Autores principales: | , , , , |
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
| Publicado: |
Nature Publishing Group UK
2018
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| Materias: | |
| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6200795/ https://www.ncbi.nlm.nih.gov/pubmed/30356063 http://dx.doi.org/10.1038/s41467-018-06952-1 |