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Contactless photomagnetoelectric investigations of 2D semiconductors

Background: Applications of two-dimensional (2D) materials in electronic devices require the development of appropriate measuring methods for determining their typical semiconductor parameters, i.e., mobility and carrier lifetime. Among these methods, contactless techniques and mobility extraction m...

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Detalles Bibliográficos
Autores principales:	Nowak, Marian, Jesionek, Marcin, Solecka, Barbara, Szperlich, Piotr, Duka, Piotr, Starczewska, Anna
Formato:	Online Artículo Texto
Lenguaje:	English
Publicado:	Beilstein-Institut 2018
Materias:	Full Research Paper
Acceso en línea:	https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6204781/ https://www.ncbi.nlm.nih.gov/pubmed/30416925 http://dx.doi.org/10.3762/bjnano.9.256

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