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Development of a Non-Invasive On-Chip Interconnect Health Sensing Method Based on Bit Error Rates
Electronic products and systems are widely used in industrial network systems, control devices, and data acquisition devices across many industry sectors. Failures of such electronic systems might lead to unexpected downtime, loss of productivity, additional work for repairs, and delay in product an...
| Autores principales: | , , |
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
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MDPI
2018
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| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6210517/ https://www.ncbi.nlm.nih.gov/pubmed/30261598 http://dx.doi.org/10.3390/s18103234 |