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Terahertz Imaging of Thin Film Layers with Matched Field Processing
Terahertz (THz) time of flight (TOF) tomography systems offer a new measurement modality for non-destructive evaluation (NDE) of the subsurface layers of protective coatings and/or laminated composite materials for industrial, security and biomedical applications. However, for thin film samples, the...
| Autores principales: | , |
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
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MDPI
2018
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| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6210592/ https://www.ncbi.nlm.nih.gov/pubmed/30347738 http://dx.doi.org/10.3390/s18103547 |