Rayleigh-scattering microscopy for tracking and sizing nanoparticles in focused aerosol beams

Ultra-bright femtosecond X-ray pulses generated by X-ray free-electron lasers (XFELs) can be used to image high-resolution structures without the need for crystallization. For this approach, aerosol injection has been a successful method to deliver 70–2000 nm particles into the XFEL beam efficiently...

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Detalles Bibliográficos
Autores principales: Hantke, Max F., Bielecki, Johan, Kulyk, Olena, Westphal, Daniel, Larsson, Daniel S. D., Svenda, Martin, Reddy, Hemanth K. N., Kirian, Richard A., Andreasson, Jakob, Hajdu, Janos, Maia, Filipe R. N. C.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: International Union of Crystallography 2018
Materias:
Research Papers
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6211534/
https://www.ncbi.nlm.nih.gov/pubmed/30443352
http://dx.doi.org/10.1107/S2052252518010837

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6211534/
https://www.ncbi.nlm.nih.gov/pubmed/30443352
http://dx.doi.org/10.1107/S2052252518010837

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