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Rayleigh-scattering microscopy for tracking and sizing nanoparticles in focused aerosol beams
Ultra-bright femtosecond X-ray pulses generated by X-ray free-electron lasers (XFELs) can be used to image high-resolution structures without the need for crystallization. For this approach, aerosol injection has been a successful method to deliver 70–2000 nm particles into the XFEL beam efficiently...
Autores principales: | Hantke, Max F., Bielecki, Johan, Kulyk, Olena, Westphal, Daniel, Larsson, Daniel S. D., Svenda, Martin, Reddy, Hemanth K. N., Kirian, Richard A., Andreasson, Jakob, Hajdu, Janos, Maia, Filipe R. N. C. |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
International Union of Crystallography
2018
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6211534/ https://www.ncbi.nlm.nih.gov/pubmed/30443352 http://dx.doi.org/10.1107/S2052252518010837 |
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