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Electric Current Dependent Fracture in GaN Piezoelectric Semiconductor Ceramics

In this paper, the fracture behavior of GaN piezoelectric semiconductor ceramics was investigated under combined mechanical and electric loading by using three-point bending tests and numerical analysis. The experimental results demonstrate that, in contrast to traditional insulating piezoelectric c...

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Detalles Bibliográficos
Autores principales:	Qin, Guoshuai, Lu, Chunsheng, Zhang, Xin, Zhao, Minghao
Formato:	Online Artículo Texto
Lenguaje:	English
Publicado:	MDPI 2018
Materias:	Article
Acceso en línea:	https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6212918/ https://www.ncbi.nlm.nih.gov/pubmed/30332845 http://dx.doi.org/10.3390/ma11102000

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