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Reliability of X7R Multilayer Ceramic Capacitors During High Accelerated Life Testing (HALT)

Multilayer ceramic capacitors (MLCC) are essential components for determining the reliability of electronic components in terms of time to failure. It is known that the reliability of MLCCs depends on their composition, processing, and operating conditions. In this present work, we analyzed the life...

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Autores principales: Hernández-López, Ana María, Aguilar-Garib, Juan Antonio, Guillemet-Fritsch, Sophie, Nava-Quintero, Roman, Dufour, Pascal, Tenailleau, Christophe, Durand, Bernard, Valdez-Nava, Zarel
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2018
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6213711/
https://www.ncbi.nlm.nih.gov/pubmed/30287768
http://dx.doi.org/10.3390/ma11101900
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author Hernández-López, Ana María
Aguilar-Garib, Juan Antonio
Guillemet-Fritsch, Sophie
Nava-Quintero, Roman
Dufour, Pascal
Tenailleau, Christophe
Durand, Bernard
Valdez-Nava, Zarel
author_facet Hernández-López, Ana María
Aguilar-Garib, Juan Antonio
Guillemet-Fritsch, Sophie
Nava-Quintero, Roman
Dufour, Pascal
Tenailleau, Christophe
Durand, Bernard
Valdez-Nava, Zarel
author_sort Hernández-López, Ana María
collection PubMed
description Multilayer ceramic capacitors (MLCC) are essential components for determining the reliability of electronic components in terms of time to failure. It is known that the reliability of MLCCs depends on their composition, processing, and operating conditions. In this present work, we analyzed the lifetime of three similar X7R type MLCCs based on BaTiO(3) by conducting High Accelerated Life Tests (HALT) at temperatures up to 200 °C at 400 V and 600 V. The results were adjusted to an Arrhenius equation, which is a function of the activation energy (E(a)) and a voltage stress exponent (n), in order to predict their time to failure. The values of E(a) are in the range of 1–1.45 eV, which has been reported for the thermal failure and dielectric wear out of BaTiO(3)-based dielectric capacitors. The stress voltage exponent value was in the range of 4–5. Although the E(a) can be associated with a failure mechanism, n only gives an indication of the effect of voltage in the tests. It was possible to associate those values with each type of tested MLCC so that their expected life could be estimated in the range of 400–600 V.
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spelling pubmed-62137112018-11-14 Reliability of X7R Multilayer Ceramic Capacitors During High Accelerated Life Testing (HALT) Hernández-López, Ana María Aguilar-Garib, Juan Antonio Guillemet-Fritsch, Sophie Nava-Quintero, Roman Dufour, Pascal Tenailleau, Christophe Durand, Bernard Valdez-Nava, Zarel Materials (Basel) Article Multilayer ceramic capacitors (MLCC) are essential components for determining the reliability of electronic components in terms of time to failure. It is known that the reliability of MLCCs depends on their composition, processing, and operating conditions. In this present work, we analyzed the lifetime of three similar X7R type MLCCs based on BaTiO(3) by conducting High Accelerated Life Tests (HALT) at temperatures up to 200 °C at 400 V and 600 V. The results were adjusted to an Arrhenius equation, which is a function of the activation energy (E(a)) and a voltage stress exponent (n), in order to predict their time to failure. The values of E(a) are in the range of 1–1.45 eV, which has been reported for the thermal failure and dielectric wear out of BaTiO(3)-based dielectric capacitors. The stress voltage exponent value was in the range of 4–5. Although the E(a) can be associated with a failure mechanism, n only gives an indication of the effect of voltage in the tests. It was possible to associate those values with each type of tested MLCC so that their expected life could be estimated in the range of 400–600 V. MDPI 2018-10-04 /pmc/articles/PMC6213711/ /pubmed/30287768 http://dx.doi.org/10.3390/ma11101900 Text en © 2018 by the authors. Licensee MDPI, Basel, Switzerland. This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution (CC BY) license (http://creativecommons.org/licenses/by/4.0/).
spellingShingle Article
Hernández-López, Ana María
Aguilar-Garib, Juan Antonio
Guillemet-Fritsch, Sophie
Nava-Quintero, Roman
Dufour, Pascal
Tenailleau, Christophe
Durand, Bernard
Valdez-Nava, Zarel
Reliability of X7R Multilayer Ceramic Capacitors During High Accelerated Life Testing (HALT)
title Reliability of X7R Multilayer Ceramic Capacitors During High Accelerated Life Testing (HALT)
title_full Reliability of X7R Multilayer Ceramic Capacitors During High Accelerated Life Testing (HALT)
title_fullStr Reliability of X7R Multilayer Ceramic Capacitors During High Accelerated Life Testing (HALT)
title_full_unstemmed Reliability of X7R Multilayer Ceramic Capacitors During High Accelerated Life Testing (HALT)
title_short Reliability of X7R Multilayer Ceramic Capacitors During High Accelerated Life Testing (HALT)
title_sort reliability of x7r multilayer ceramic capacitors during high accelerated life testing (halt)
topic Article
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6213711/
https://www.ncbi.nlm.nih.gov/pubmed/30287768
http://dx.doi.org/10.3390/ma11101900
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