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Nb(2)O(5) and Ti-Doped Nb(2)O(5) Charge Trapping Nano-Layers Applied in Flash Memory
High-k material charge trapping nano-layers in flash memory applications have faster program/erase speeds and better data retention because of larger conduction band offsets and higher dielectric constants. In addition, Ti-doped high-k materials can improve memory device performance, such as leakage...
Autores principales: | Wang, Jer Chyi, Kao, Chyuan Haur, Wu, Chien Hung, Lin, Chun Fu, Lin, Chih Ju |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
MDPI
2018
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6215173/ https://www.ncbi.nlm.nih.gov/pubmed/30297613 http://dx.doi.org/10.3390/nano8100799 |
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