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Tunnel Encapsulation Technology for Durability Improvement in Stretchable Electronics Fabrication
Great diversity of process technologies and materials have been developed around stretchable electronics. A subset of them, which are made up of zigzag metal foil and soft silicon polymers, show advantages of being easy to manufacture and low cost. However, most of the circuits lack durability due t...
Autores principales: | , , , |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
MDPI
2018
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6215241/ https://www.ncbi.nlm.nih.gov/pubmed/30424452 http://dx.doi.org/10.3390/mi9100519 |
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author | Leng, Kangmin Guo, Chuanfei Wu, Kang Wu, Zhigang |
author_facet | Leng, Kangmin Guo, Chuanfei Wu, Kang Wu, Zhigang |
author_sort | Leng, Kangmin |
collection | PubMed |
description | Great diversity of process technologies and materials have been developed around stretchable electronics. A subset of them, which are made up of zigzag metal foil and soft silicon polymers, show advantages of being easy to manufacture and low cost. However, most of the circuits lack durability due to stress concentration of interconnects entirely embedded in elastic polymer silicone such as polydimethylsiloxane (PDMS). In our demonstration, tunnel encapsulation technology was introduced to relieve stress of these conductors when they were stretched to deform in and out of plane. It was realized by dissolving the medium of Polyvinyl Alcohol (PVA), previous cured together with circuits in polymer, to form the micro-tunnel which not only guarantee the stretchability of interconnect, but also help to improve the durability. With the protection of tunnel, the serpentine could stably maintain the designed shape and electrical performance after 50% strain cycling over 20,000 times. Finally, different materials for encapsulation were employed to provide promising options for applications in portable biomedical devices which demand duplicate distortion. |
format | Online Article Text |
id | pubmed-6215241 |
institution | National Center for Biotechnology Information |
language | English |
publishDate | 2018 |
publisher | MDPI |
record_format | MEDLINE/PubMed |
spelling | pubmed-62152412018-11-06 Tunnel Encapsulation Technology for Durability Improvement in Stretchable Electronics Fabrication Leng, Kangmin Guo, Chuanfei Wu, Kang Wu, Zhigang Micromachines (Basel) Article Great diversity of process technologies and materials have been developed around stretchable electronics. A subset of them, which are made up of zigzag metal foil and soft silicon polymers, show advantages of being easy to manufacture and low cost. However, most of the circuits lack durability due to stress concentration of interconnects entirely embedded in elastic polymer silicone such as polydimethylsiloxane (PDMS). In our demonstration, tunnel encapsulation technology was introduced to relieve stress of these conductors when they were stretched to deform in and out of plane. It was realized by dissolving the medium of Polyvinyl Alcohol (PVA), previous cured together with circuits in polymer, to form the micro-tunnel which not only guarantee the stretchability of interconnect, but also help to improve the durability. With the protection of tunnel, the serpentine could stably maintain the designed shape and electrical performance after 50% strain cycling over 20,000 times. Finally, different materials for encapsulation were employed to provide promising options for applications in portable biomedical devices which demand duplicate distortion. MDPI 2018-10-14 /pmc/articles/PMC6215241/ /pubmed/30424452 http://dx.doi.org/10.3390/mi9100519 Text en © 2018 by the authors. Licensee MDPI, Basel, Switzerland. This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution (CC BY) license (http://creativecommons.org/licenses/by/4.0/). |
spellingShingle | Article Leng, Kangmin Guo, Chuanfei Wu, Kang Wu, Zhigang Tunnel Encapsulation Technology for Durability Improvement in Stretchable Electronics Fabrication |
title | Tunnel Encapsulation Technology for Durability Improvement in Stretchable Electronics Fabrication |
title_full | Tunnel Encapsulation Technology for Durability Improvement in Stretchable Electronics Fabrication |
title_fullStr | Tunnel Encapsulation Technology for Durability Improvement in Stretchable Electronics Fabrication |
title_full_unstemmed | Tunnel Encapsulation Technology for Durability Improvement in Stretchable Electronics Fabrication |
title_short | Tunnel Encapsulation Technology for Durability Improvement in Stretchable Electronics Fabrication |
title_sort | tunnel encapsulation technology for durability improvement in stretchable electronics fabrication |
topic | Article |
url | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6215241/ https://www.ncbi.nlm.nih.gov/pubmed/30424452 http://dx.doi.org/10.3390/mi9100519 |
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