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Tunnel Encapsulation Technology for Durability Improvement in Stretchable Electronics Fabrication

Great diversity of process technologies and materials have been developed around stretchable electronics. A subset of them, which are made up of zigzag metal foil and soft silicon polymers, show advantages of being easy to manufacture and low cost. However, most of the circuits lack durability due t...

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Detalles Bibliográficos
Autores principales: Leng, Kangmin, Guo, Chuanfei, Wu, Kang, Wu, Zhigang
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2018
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6215241/
https://www.ncbi.nlm.nih.gov/pubmed/30424452
http://dx.doi.org/10.3390/mi9100519
_version_ 1783368109218856960
author Leng, Kangmin
Guo, Chuanfei
Wu, Kang
Wu, Zhigang
author_facet Leng, Kangmin
Guo, Chuanfei
Wu, Kang
Wu, Zhigang
author_sort Leng, Kangmin
collection PubMed
description Great diversity of process technologies and materials have been developed around stretchable electronics. A subset of them, which are made up of zigzag metal foil and soft silicon polymers, show advantages of being easy to manufacture and low cost. However, most of the circuits lack durability due to stress concentration of interconnects entirely embedded in elastic polymer silicone such as polydimethylsiloxane (PDMS). In our demonstration, tunnel encapsulation technology was introduced to relieve stress of these conductors when they were stretched to deform in and out of plane. It was realized by dissolving the medium of Polyvinyl Alcohol (PVA), previous cured together with circuits in polymer, to form the micro-tunnel which not only guarantee the stretchability of interconnect, but also help to improve the durability. With the protection of tunnel, the serpentine could stably maintain the designed shape and electrical performance after 50% strain cycling over 20,000 times. Finally, different materials for encapsulation were employed to provide promising options for applications in portable biomedical devices which demand duplicate distortion.
format Online
Article
Text
id pubmed-6215241
institution National Center for Biotechnology Information
language English
publishDate 2018
publisher MDPI
record_format MEDLINE/PubMed
spelling pubmed-62152412018-11-06 Tunnel Encapsulation Technology for Durability Improvement in Stretchable Electronics Fabrication Leng, Kangmin Guo, Chuanfei Wu, Kang Wu, Zhigang Micromachines (Basel) Article Great diversity of process technologies and materials have been developed around stretchable electronics. A subset of them, which are made up of zigzag metal foil and soft silicon polymers, show advantages of being easy to manufacture and low cost. However, most of the circuits lack durability due to stress concentration of interconnects entirely embedded in elastic polymer silicone such as polydimethylsiloxane (PDMS). In our demonstration, tunnel encapsulation technology was introduced to relieve stress of these conductors when they were stretched to deform in and out of plane. It was realized by dissolving the medium of Polyvinyl Alcohol (PVA), previous cured together with circuits in polymer, to form the micro-tunnel which not only guarantee the stretchability of interconnect, but also help to improve the durability. With the protection of tunnel, the serpentine could stably maintain the designed shape and electrical performance after 50% strain cycling over 20,000 times. Finally, different materials for encapsulation were employed to provide promising options for applications in portable biomedical devices which demand duplicate distortion. MDPI 2018-10-14 /pmc/articles/PMC6215241/ /pubmed/30424452 http://dx.doi.org/10.3390/mi9100519 Text en © 2018 by the authors. Licensee MDPI, Basel, Switzerland. This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution (CC BY) license (http://creativecommons.org/licenses/by/4.0/).
spellingShingle Article
Leng, Kangmin
Guo, Chuanfei
Wu, Kang
Wu, Zhigang
Tunnel Encapsulation Technology for Durability Improvement in Stretchable Electronics Fabrication
title Tunnel Encapsulation Technology for Durability Improvement in Stretchable Electronics Fabrication
title_full Tunnel Encapsulation Technology for Durability Improvement in Stretchable Electronics Fabrication
title_fullStr Tunnel Encapsulation Technology for Durability Improvement in Stretchable Electronics Fabrication
title_full_unstemmed Tunnel Encapsulation Technology for Durability Improvement in Stretchable Electronics Fabrication
title_short Tunnel Encapsulation Technology for Durability Improvement in Stretchable Electronics Fabrication
title_sort tunnel encapsulation technology for durability improvement in stretchable electronics fabrication
topic Article
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6215241/
https://www.ncbi.nlm.nih.gov/pubmed/30424452
http://dx.doi.org/10.3390/mi9100519
work_keys_str_mv AT lengkangmin tunnelencapsulationtechnologyfordurabilityimprovementinstretchableelectronicsfabrication
AT guochuanfei tunnelencapsulationtechnologyfordurabilityimprovementinstretchableelectronicsfabrication
AT wukang tunnelencapsulationtechnologyfordurabilityimprovementinstretchableelectronicsfabrication
AT wuzhigang tunnelencapsulationtechnologyfordurabilityimprovementinstretchableelectronicsfabrication