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Automatic projection image registration for nanoscale X-ray tomographic reconstruction

Novel developments in X-ray sources, optics and detectors have significantly advanced the capability of X-ray microscopy at the nanoscale. Depending on the imaging modality and the photon energy, state-of-the-art X-ray microscopes are routinely operated at a spatial resolution of tens of nanometres...

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Autores principales: Yu, Haiyan, Xia, Sihao, Wei, Chenxi, Mao, Yuwei, Larsson, Daniel, Xiao, Xianghui, Pianetta, Piero, Yu, Young-Sang, Liu, Yijin
Formato: Online Artículo Texto
Lenguaje:English
Publicado: International Union of Crystallography 2018
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6225741/
https://www.ncbi.nlm.nih.gov/pubmed/30407194
http://dx.doi.org/10.1107/S1600577518013929
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author Yu, Haiyan
Xia, Sihao
Wei, Chenxi
Mao, Yuwei
Larsson, Daniel
Xiao, Xianghui
Pianetta, Piero
Yu, Young-Sang
Liu, Yijin
author_facet Yu, Haiyan
Xia, Sihao
Wei, Chenxi
Mao, Yuwei
Larsson, Daniel
Xiao, Xianghui
Pianetta, Piero
Yu, Young-Sang
Liu, Yijin
author_sort Yu, Haiyan
collection PubMed
description Novel developments in X-ray sources, optics and detectors have significantly advanced the capability of X-ray microscopy at the nanoscale. Depending on the imaging modality and the photon energy, state-of-the-art X-ray microscopes are routinely operated at a spatial resolution of tens of nanometres for hard X-rays or ∼10 nm for soft X-rays. The improvement in spatial resolution, however, has led to challenges in the tomographic reconstruction due to the fact that the imperfections of the mechanical system become clearly detectable in the projection images. Without proper registration of the projection images, a severe point spread function will be introduced into the tomographic reconstructions, causing the reduction of the three-dimensional (3D) spatial resolution as well as the enhancement of image artifacts. Here the development of a method that iteratively performs registration of the experimentally measured projection images to those that are numerically calculated by reprojecting the 3D matrix in the corresponding viewing angles is shown. Multiple algorithms are implemented to conduct the registration, which corrects the translational and/or the rotational errors. A sequence that offers a superior performance is presented and discussed. Going beyond the visual assessment of the reconstruction results, the morphological quantification of a battery electrode particle that has gone through substantial cycling is investigated. The results show that the presented method has led to a better quality tomographic reconstruction, which, subsequently, promotes the fidelity in the quantification of the sample morphology.
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spelling pubmed-62257412018-11-19 Automatic projection image registration for nanoscale X-ray tomographic reconstruction Yu, Haiyan Xia, Sihao Wei, Chenxi Mao, Yuwei Larsson, Daniel Xiao, Xianghui Pianetta, Piero Yu, Young-Sang Liu, Yijin J Synchrotron Radiat Research Papers Novel developments in X-ray sources, optics and detectors have significantly advanced the capability of X-ray microscopy at the nanoscale. Depending on the imaging modality and the photon energy, state-of-the-art X-ray microscopes are routinely operated at a spatial resolution of tens of nanometres for hard X-rays or ∼10 nm for soft X-rays. The improvement in spatial resolution, however, has led to challenges in the tomographic reconstruction due to the fact that the imperfections of the mechanical system become clearly detectable in the projection images. Without proper registration of the projection images, a severe point spread function will be introduced into the tomographic reconstructions, causing the reduction of the three-dimensional (3D) spatial resolution as well as the enhancement of image artifacts. Here the development of a method that iteratively performs registration of the experimentally measured projection images to those that are numerically calculated by reprojecting the 3D matrix in the corresponding viewing angles is shown. Multiple algorithms are implemented to conduct the registration, which corrects the translational and/or the rotational errors. A sequence that offers a superior performance is presented and discussed. Going beyond the visual assessment of the reconstruction results, the morphological quantification of a battery electrode particle that has gone through substantial cycling is investigated. The results show that the presented method has led to a better quality tomographic reconstruction, which, subsequently, promotes the fidelity in the quantification of the sample morphology. International Union of Crystallography 2018-10-23 /pmc/articles/PMC6225741/ /pubmed/30407194 http://dx.doi.org/10.1107/S1600577518013929 Text en © Haiyan Yu et al. 2018 http://creativecommons.org/licenses/by/2.0/uk/ This is an open-access article distributed under the terms of the Creative Commons Attribution (CC-BY) Licence, which permits unrestricted use, distribution, and reproduction in any medium, provided the original authors and source are cited.http://creativecommons.org/licenses/by/2.0/uk/
spellingShingle Research Papers
Yu, Haiyan
Xia, Sihao
Wei, Chenxi
Mao, Yuwei
Larsson, Daniel
Xiao, Xianghui
Pianetta, Piero
Yu, Young-Sang
Liu, Yijin
Automatic projection image registration for nanoscale X-ray tomographic reconstruction
title Automatic projection image registration for nanoscale X-ray tomographic reconstruction
title_full Automatic projection image registration for nanoscale X-ray tomographic reconstruction
title_fullStr Automatic projection image registration for nanoscale X-ray tomographic reconstruction
title_full_unstemmed Automatic projection image registration for nanoscale X-ray tomographic reconstruction
title_short Automatic projection image registration for nanoscale X-ray tomographic reconstruction
title_sort automatic projection image registration for nanoscale x-ray tomographic reconstruction
topic Research Papers
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6225741/
https://www.ncbi.nlm.nih.gov/pubmed/30407194
http://dx.doi.org/10.1107/S1600577518013929
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