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Estimation of the ion-trap assisted electrical loads and resulting BBR shift
Capacitive, inductive and resistive loads of an ion-trap system, which can be modelled as LCR circuits, are important to know for building a high accuracy experiment. Accurate estimation of these loads is necessary for delivering the desired radio frequency (RF) signal to an ion trap via an RF reson...
Autores principales: | , , , , |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
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Nature Publishing Group UK
2018
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6237823/ https://www.ncbi.nlm.nih.gov/pubmed/30443030 http://dx.doi.org/10.1038/s41598-018-35234-5 |
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author | Sharma, Lakhi Roy, A. Panja, S. Ojha, V. N. De, S. |
author_facet | Sharma, Lakhi Roy, A. Panja, S. Ojha, V. N. De, S. |
author_sort | Sharma, Lakhi |
collection | PubMed |
description | Capacitive, inductive and resistive loads of an ion-trap system, which can be modelled as LCR circuits, are important to know for building a high accuracy experiment. Accurate estimation of these loads is necessary for delivering the desired radio frequency (RF) signal to an ion trap via an RF resonator. Of particular relevance to the trapped ion optical atomic clock, determination of these loads lead to accurate evaluation of the Black-Body Radiation (BBR) shift resulting from the inaccurate machining of the ion-trap itself. We have identified different sources of these loads and estimated their values using analytical and finite element analysis methods, which are found to be well in agreement with the experimentally measured values. For our trap geometry, we obtained values of the effective inductive, capacitive and resistive loads as: 3.1 μH, 3.71 (1) μH, 3.68 (6) μH; 50.4 pF, 51.4 (7) pF, 40.7 (2) pF; and 1.373 Ω, 1.273 (3) Ω, 1.183 (9) Ω by using analytical, numerical and experimental methods, respectively. The BBR shift induced by the excess capacitive load arising due to machining inaccuracy in the RF carrying parts has been accurately estimated, which results to a fractional frequency shift of 6.6 × 10(−17) for an RF of 1 kV at 2π × 15 MHz and with ±10 μm machining inaccuracy. This needs to be incorporated into the total systematic uncertainty budget of a frequency standard as it is about one order of magnitude higher than the present precision of the trapped ion optical clocks. |
format | Online Article Text |
id | pubmed-6237823 |
institution | National Center for Biotechnology Information |
language | English |
publishDate | 2018 |
publisher | Nature Publishing Group UK |
record_format | MEDLINE/PubMed |
spelling | pubmed-62378232018-11-23 Estimation of the ion-trap assisted electrical loads and resulting BBR shift Sharma, Lakhi Roy, A. Panja, S. Ojha, V. N. De, S. Sci Rep Article Capacitive, inductive and resistive loads of an ion-trap system, which can be modelled as LCR circuits, are important to know for building a high accuracy experiment. Accurate estimation of these loads is necessary for delivering the desired radio frequency (RF) signal to an ion trap via an RF resonator. Of particular relevance to the trapped ion optical atomic clock, determination of these loads lead to accurate evaluation of the Black-Body Radiation (BBR) shift resulting from the inaccurate machining of the ion-trap itself. We have identified different sources of these loads and estimated their values using analytical and finite element analysis methods, which are found to be well in agreement with the experimentally measured values. For our trap geometry, we obtained values of the effective inductive, capacitive and resistive loads as: 3.1 μH, 3.71 (1) μH, 3.68 (6) μH; 50.4 pF, 51.4 (7) pF, 40.7 (2) pF; and 1.373 Ω, 1.273 (3) Ω, 1.183 (9) Ω by using analytical, numerical and experimental methods, respectively. The BBR shift induced by the excess capacitive load arising due to machining inaccuracy in the RF carrying parts has been accurately estimated, which results to a fractional frequency shift of 6.6 × 10(−17) for an RF of 1 kV at 2π × 15 MHz and with ±10 μm machining inaccuracy. This needs to be incorporated into the total systematic uncertainty budget of a frequency standard as it is about one order of magnitude higher than the present precision of the trapped ion optical clocks. Nature Publishing Group UK 2018-11-15 /pmc/articles/PMC6237823/ /pubmed/30443030 http://dx.doi.org/10.1038/s41598-018-35234-5 Text en © The Author(s) 2018 Open Access This article is licensed under a Creative Commons Attribution 4.0 International License, which permits use, sharing, adaptation, distribution and reproduction in any medium or format, as long as you give appropriate credit to the original author(s) and the source, provide a link to the Creative Commons license, and indicate if changes were made. The images or other third party material in this article are included in the article’s Creative Commons license, unless indicated otherwise in a credit line to the material. If material is not included in the article’s Creative Commons license and your intended use is not permitted by statutory regulation or exceeds the permitted use, you will need to obtain permission directly from the copyright holder. To view a copy of this license, visit http://creativecommons.org/licenses/by/4.0/. |
spellingShingle | Article Sharma, Lakhi Roy, A. Panja, S. Ojha, V. N. De, S. Estimation of the ion-trap assisted electrical loads and resulting BBR shift |
title | Estimation of the ion-trap assisted electrical loads and resulting BBR shift |
title_full | Estimation of the ion-trap assisted electrical loads and resulting BBR shift |
title_fullStr | Estimation of the ion-trap assisted electrical loads and resulting BBR shift |
title_full_unstemmed | Estimation of the ion-trap assisted electrical loads and resulting BBR shift |
title_short | Estimation of the ion-trap assisted electrical loads and resulting BBR shift |
title_sort | estimation of the ion-trap assisted electrical loads and resulting bbr shift |
topic | Article |
url | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6237823/ https://www.ncbi.nlm.nih.gov/pubmed/30443030 http://dx.doi.org/10.1038/s41598-018-35234-5 |
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