Cargando…
Charged particle single nanometre manufacturing
Following a brief historical summary of the way in which electron beam lithography developed out of the scanning electron microscope, three state-of-the-art charged-particle beam nanopatterning technologies are considered. All three have been the subject of a recently completed European Union Projec...
Autores principales: | Prewett, Philip D, Hagen, Cornelis W, Lenk, Claudia, Lenk, Steve, Kaestner, Marcus, Ivanov, Tzvetan, Ahmad, Ahmad, Rangelow, Ivo W, Shi, Xiaoqing, Boden, Stuart A, Robinson, Alex P G, Yang, Dongxu, Hari, Sangeetha, Scotuzzi, Marijke, Huq, Ejaz |
---|---|
Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
Beilstein-Institut
2018
|
Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6244241/ https://www.ncbi.nlm.nih.gov/pubmed/30498657 http://dx.doi.org/10.3762/bjnano.9.266 |
Ejemplares similares
-
Sensitivity Improvement to Active Piezoresistive AFM Probes Using Focused Ion Beam Processing
por: Kunicki, Piotr, et al.
Publicado: (2019) -
Lights Out! Nano-Scale Topography Imaging of Sample Surface in Opaque Liquid Environments with Coated Active Cantilever Probes
por: Xia, Fangzhou, et al.
Publicado: (2019) -
Increased imaging speed and force sensitivity for bio-applications with small cantilevers using a conventional AFM setup
por: Leitner, Michael, et al.
Publicado: (2012) -
Practical lighting design with LEDs
por: Lenk, Ron, et al.
Publicado: (2016) -
Practical lighting design with LEDs
por: Lenk, Ron, et al.
Publicado: (2011)