Cargando…
Dataset of ptychographic X-ray computed tomography of inverse opal photonic crystals produced by atomic layer deposition
This data article describes the detailed parameters for synthesizing mullite inverse opal photonic crystals via Atomic Layer Deposition (ALD), as well as the detailed image analysis routine used to interpret the data obtained by the measurement of such photonic crystals, before and after the heat tr...
Autores principales: | Furlan, Kaline P., Larsson, Emanuel, Diaz, Ana, Holler, Mirko, Krekeler, Tobias, Ritter, Martin, Petrov, Alexander Yu., Eich, Manfred, Blick, Robert, Schneider, Gerold A., Greving, Imke, Zierold, Robert, Janßen, Rolf |
---|---|
Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
Elsevier
2018
|
Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6260412/ https://www.ncbi.nlm.nih.gov/pubmed/30519618 http://dx.doi.org/10.1016/j.dib.2018.10.076 |
Ejemplares similares
-
Transparency induced in opals via nanometer thick conformal coating
por: Shang, Guoliang, et al.
Publicado: (2019) -
Influence of Alumina Addition on the Optical Properties and the Thermal Stability of Titania Thin Films and Inverse Opals Produced by Atomic Layer Deposition
por: Waleczek, Martin, et al.
Publicado: (2021) -
Ptychographic measurements of varying size and shape along zeolite channels
por: Sha, Haozhi, et al.
Publicado: (2023) -
Structural degradation of tungsten sandwiched in hafnia layers determined by in-situ XRD up to 1520 °C
por: Krishnamurthy, Gnanavel Vaidhyanathan, et al.
Publicado: (2021) -
X‐ray Stain Localization with Near‐Field Ptychographic Computed Tomography
por: Taphorn, Kirsten, et al.
Publicado: (2022)