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Reappraising the Luminescence Lifetime Distributions in Silicon Nanocrystals

The luminescence dynamics in ensembles of nanocrystals are complicated by a variety of processes, including the size-dependence of the radiative and non-radiative rates in inhomogeneous broadened samples and interparticle interactions. This results in a non-exponential decay, which for the specific...

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Autores principales: Jakob, Matthias, Aissiou, Amira, Morrish, William, Marsiglio, Frank, Islam, Muhammad, Kartouzian, Aras, Meldrum, Alkiviathes
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Springer US 2018
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6261909/
https://www.ncbi.nlm.nih.gov/pubmed/30488251
http://dx.doi.org/10.1186/s11671-018-2785-x
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author Jakob, Matthias
Aissiou, Amira
Morrish, William
Marsiglio, Frank
Islam, Muhammad
Kartouzian, Aras
Meldrum, Alkiviathes
author_facet Jakob, Matthias
Aissiou, Amira
Morrish, William
Marsiglio, Frank
Islam, Muhammad
Kartouzian, Aras
Meldrum, Alkiviathes
author_sort Jakob, Matthias
collection PubMed
description The luminescence dynamics in ensembles of nanocrystals are complicated by a variety of processes, including the size-dependence of the radiative and non-radiative rates in inhomogeneous broadened samples and interparticle interactions. This results in a non-exponential decay, which for the specific case of silicon nanocrystals (SiNCs) has been widely modeled with a Kohlrausch or “stretched exponential” (SE) function. We first derive the population decay function for a luminescence decay following exp[− (t/τ)(β)]. We then compare the distributions and mean times calculated by assuming that either the luminescence decay or the population decay follows this function and show that the results are significantly different for β much below 1. We then apply these two types of SE functions as well as other models to the luminescence decay data from two thermally grown SiNC samples with different mean sizes. The mean lifetimes are strongly dependent on the experimental setup and the chosen fitting model, none of which appears to adequately describe the ensemble decay dynamics. Frequency-resolved spectroscopy (FRS) techniques are then applied to SiNCs in order to extract the lifetime distribution directly. The rate distribution has a half width of ~ 0.5 decades and mainly resembles a somewhat high-frequency-skewed lognormal function. The combination of TRS and FRS methods appear best suited to uncovering the luminescence dynamics of NC materials having a broad emission spectrum. ELECTRONIC SUPPLEMENTARY MATERIAL: The online version of this article (10.1186/s11671-018-2785-x) contains supplementary material, which is available to authorized users.
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spelling pubmed-62619092018-12-11 Reappraising the Luminescence Lifetime Distributions in Silicon Nanocrystals Jakob, Matthias Aissiou, Amira Morrish, William Marsiglio, Frank Islam, Muhammad Kartouzian, Aras Meldrum, Alkiviathes Nanoscale Res Lett Nano Express The luminescence dynamics in ensembles of nanocrystals are complicated by a variety of processes, including the size-dependence of the radiative and non-radiative rates in inhomogeneous broadened samples and interparticle interactions. This results in a non-exponential decay, which for the specific case of silicon nanocrystals (SiNCs) has been widely modeled with a Kohlrausch or “stretched exponential” (SE) function. We first derive the population decay function for a luminescence decay following exp[− (t/τ)(β)]. We then compare the distributions and mean times calculated by assuming that either the luminescence decay or the population decay follows this function and show that the results are significantly different for β much below 1. We then apply these two types of SE functions as well as other models to the luminescence decay data from two thermally grown SiNC samples with different mean sizes. The mean lifetimes are strongly dependent on the experimental setup and the chosen fitting model, none of which appears to adequately describe the ensemble decay dynamics. Frequency-resolved spectroscopy (FRS) techniques are then applied to SiNCs in order to extract the lifetime distribution directly. The rate distribution has a half width of ~ 0.5 decades and mainly resembles a somewhat high-frequency-skewed lognormal function. The combination of TRS and FRS methods appear best suited to uncovering the luminescence dynamics of NC materials having a broad emission spectrum. ELECTRONIC SUPPLEMENTARY MATERIAL: The online version of this article (10.1186/s11671-018-2785-x) contains supplementary material, which is available to authorized users. Springer US 2018-11-28 /pmc/articles/PMC6261909/ /pubmed/30488251 http://dx.doi.org/10.1186/s11671-018-2785-x Text en © The Author(s). 2018 Open AccessThis article is distributed under the terms of the Creative Commons Attribution 4.0 International License (http://creativecommons.org/licenses/by/4.0/), which permits unrestricted use, distribution, and reproduction in any medium, provided you give appropriate credit to the original author(s) and the source, provide a link to the Creative Commons license, and indicate if changes were made.
spellingShingle Nano Express
Jakob, Matthias
Aissiou, Amira
Morrish, William
Marsiglio, Frank
Islam, Muhammad
Kartouzian, Aras
Meldrum, Alkiviathes
Reappraising the Luminescence Lifetime Distributions in Silicon Nanocrystals
title Reappraising the Luminescence Lifetime Distributions in Silicon Nanocrystals
title_full Reappraising the Luminescence Lifetime Distributions in Silicon Nanocrystals
title_fullStr Reappraising the Luminescence Lifetime Distributions in Silicon Nanocrystals
title_full_unstemmed Reappraising the Luminescence Lifetime Distributions in Silicon Nanocrystals
title_short Reappraising the Luminescence Lifetime Distributions in Silicon Nanocrystals
title_sort reappraising the luminescence lifetime distributions in silicon nanocrystals
topic Nano Express
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6261909/
https://www.ncbi.nlm.nih.gov/pubmed/30488251
http://dx.doi.org/10.1186/s11671-018-2785-x
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