Highly Sensitive Charge Sensor Based on Atom-Assisted High-Order Sideband Generation in a Hybrid Optomechanical System

Realizing highly sensitive charge sensors is of fundamental importance in physics, and may find applications in metrology, electronic tunnel imaging, and engineering technology. With the development of nanophotonics, cavity optomechanics with Coulomb interaction provides a powerful platform to explore new options for the precision measurement of charges. In this work, a method of realizing a highly sensitive charge sensor based on atom-assisted high-order sideband generation in a hybrid optomechanical system is proposed. The advantage of this scheme is that the sideband cutoff order and the charge number satisfy a monotonically increasing relationship, which is more sensitive than the atom-free case discussed previously. Calculations show that the sensitivity of the charge sensor in our scheme is improved by about 25 times. In particular, our proposed charge sensor can operate in low power conditions and extremely weak charge measurement environments. Furthermore, phase-dependent effects between the sideband generation and Coulomb interaction are also discussed in detail. Beyond their fundamental scientific significance, our work is an important step toward measuring individual charge.