Cargando…
Microscopic Three-Dimensional Measurement Based on Telecentric Stereo and Speckle Projection Methods
Three-dimensional (3D) measurement of microstructures has become increasingly important, and many microscopic measurement methods have been developed. For the dimension in several millimeters together with the accuracy at sub-pixel or sub-micron level, there is almost no effective measurement method...
Autores principales: | Chen, Kepeng, Shi, Tielin, Liu, Qiang, Tang, Zirong, Liao, Guanglan |
---|---|
Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
MDPI
2018
|
Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6263875/ https://www.ncbi.nlm.nih.gov/pubmed/30423883 http://dx.doi.org/10.3390/s18113882 |
Ejemplares similares
-
Three-dimensional MoS(2)/Graphene Aerogel as Binder-free Electrode for Li-ion Battery
por: Zhong, Yan, et al.
Publicado: (2019) -
Controllable Synthesis of All Inorganic Lead Halide Perovskite Nanocrystals with Various Appearances in Multiligand Reaction System
por: Chen, Chen, et al.
Publicado: (2019) -
Using Wavelet Packet Transform for Surface Roughness Evaluation and Texture Extraction
por: Wang, Xiao, et al.
Publicado: (2017) -
One-Step Mask-Based Diffraction Lithography for the Fabrication of 3D Suspended Structures
por: Tan, Xianhua, et al.
Publicado: (2018) -
Calibration of Stereo Pairs Using Speckle Metrology
por: Samson, Éric, et al.
Publicado: (2022)